Posted in | Microscopy

Can Direct Electron Detection be Used to Improve EBSD Analysis?

Summary

Electron Backscatter Diffraction (EBSD) is a very important microanalytical technique to measure and understand the crystallographic arrangements in materials. EBSD detection hardware has not changed significantly in the decades since its commercialization and performance has not always kept up with customer and sample needs.

A new type of direct electron detection hardware has been reported, which borrows technology from other applications. In this webinar we will show a comparison of this new technology to current commercial systems and also examine its performance considerations.

Speakers

Dr. Patrick Camus
Director of Research and Innovation
EDAX

Patrick Camus received a BS and PhD from University of Pittsburgh in Materials Science. He spent 18 years in Atom Probe analysis at Oak Ridge National Lab (ORNL), National Institute of Standards and Technology (NIST), and University of Wisconsin-Madison. Pat then worked for 15 years in Electron-beam microanalysis (EDS, WDS, EBSD) at Thermo Fisher Scientific. He moved to EDAX early in 2013 as Principal Product Development Engineer and became Director of Research and Innovation in 2014.

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