The JEM-1400 series 120 kV Transmission Electron Microscope available from JEOL is largely recognized for high-resolution imaging and analysis, as well as its ease of use. It is used in a wide range of applications, such as nanotechnology, biology, pathology, quality control, polymers, and materials development.
The JEM-1400Flash was launched in 2017 and is based on the highly successful JEM-1400(Plus), rendering it simple for the user to initially observe the samples at low magnification, before the fine structures of interest are analyzed at a higher magnification.
A built-in high-sensitivity sCMOS camera, an optical microscope (OM) image linkage function, and an ultra-wide area montage system provided in the JEM-1400Flash help the user to smoothly transition from low to high magnification and obtain image data of higher throughput.
A TMP provided in the JEM-1400Flash not only helps to increase the throughput but also leads to an oil-free column vacuum and enables instantaneous sample exchanges.
The JEM-1400Flash offers excellent S/TEM analytical performance, 3D tomography, high-resolution/high-contrast imaging, elemental mapping with the latest large-area SDD detectors, montaging, and cryomicroscopy.
The JEM-1400Flash is a compact and user-friendly TEM that supports optional STEM digital imaging/scanning circuitry and provides STEM images (BF/DF) on the standard GUI.
Some of the new features of the JEM-1400Flash are mentioned below.
High-Sensitivity sCMOS Camera, “Matataki Flash” Camera
JEOL’s novel high-sensitivity sCMOS camera, called “Matataki Flash,” considerably minimizes the readout noise while featuring a high frame rate. This robust feature allows high-quality TEM images to be obtained with high throughput and very low noise.
Ultra-Wide Area Montage System, Limitless Panorama (LLP)
Besides the traditional electromagnetic image shift, the JEM-1400Flash incorporates a montage system that can use the stage drive to shift the field of view. This novel system enables a montage panorama image to be captured over a limitless wide area.
Thus, an image with a high pixel resolution and ultra-wide area can be obtained and used to navigate over the entire grid in the case of a grid-sized montage. The “Limitless Panorama” option helps obtain an unlimited number of frames.
Picture Overlay (OM Image Linkage Function)
In the case of Correlative Light and Electron Microscopy (CLEM) workflows, it is possible to overlay a digital image obtained with an OM on a TEM image. This method enables combining the spatiotemporal information obtained from a fluorescence light microscope with high-resolution structural data acquired from a TEM.
Thus, the information bridged by CLEM from cells and structural biology can be extended to the integrated use of high-resolution markers for more accurate targeting of relevant fluorescent loci.
New User Interface
Apart from a new exterior finish, new designs are also used for (1) knob sets with OLED-equipped buttons that can be defined by the user for easy-to-view working, (2) a touchscreen for intuitive operation, and (3) a new Graphical User Interface. The new JEM-1400Flash is completely compatible with SerialEM for SPA and tomography workflows.
Key Features
- Simplified GUI including a multi-touch screen for ultimate ease of use
- Compact footprint
- A tilt of +/−70° with support for dual-axis tomography
- Data viewing and remote operation for collaboration
- Improved for high-contrast imaging for materials science, low Z, and biological applications
- TMP with instantaneous sample exchange
- Automated tomography from several points
- Large area SDD-EDS and STEM available
- Limitless Panorama ultra-wide area montaging
- LaB6 emitter standard
- 5-axis Microactive Goniometer supports cryo-holders