The IB-19530CP Ion Beam Cross Section Polisher (CP) available from JEOL creates pristine cross-sections of samples—soft, hard, or composites—without contaminating, distorting, crumbling, or smearing them in any way.
Until now, there was no precedent for this kind of cross-sectioning instrument for sample preparation in SAM, EPMA, and SEM.
The potential to produce ideal cross-sections of yeast, shale, paper, wire bonds, latex beads, and coatings, or produce a mirrored surface on soft materials, like glass, ceramics, polymers, and gold has significantly improved research and analysis for many customers.
An argon beam is used by the CP to mill cross-sections of samples or polish almost any material that is attached to the constantly rotating sample holder. Using the high-power optical microscope, users can place a sample within a few microns of the accurate cross-section position.
At the time of milling, the sample is automatically rocked to prevent the appearance of beam striations on the cross-sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted onto the surface of the sample.
Cooling Cross-Section Polisher with Air Isolation
JEOL provides a Cooling Cross-Section Polisher for both preparation and polishing of materials that are susceptible to exposure to thermal or air damage, like metallic lithium, galvanized steel, and solder. The CCP enables prolonged cooling periods while preserving liquid nitrogen.
Furthermore, an isolation and transfer system allows users to process the materials without exposure to air.
- Simple touch panel operation
- The mirrored surface can be cleaned with minimal distortion or strain
- Cross-section of soft, hard, and composite materials can be polished clean
- Broad area cross-sections (up to several millimeters across)
Cooling CP Advantages
- Air isolation transfer system safeguards samples that are susceptible to exposure
- Nitrogen cooling avoids thermal damage to materials that have low melting and low glass transition points