Improve Thickness and Flaw Inspection Solutions with the EPOCH 650 Ultrasonic Flaw Detector

The EPOCH 650 ultrasonic flaw detector available from Olympus features a large, full VGA transflective display together with the company’s patented digital high dynamic range receiver. The VGA display offers a stable, vivid A-scan representation in all kinds of lighting conditions.

The EPOCH 650 ultrasonic flaw detector has been specifically developed to fulfill the EN12668‑1 requirements and enables a complete range of standard and optional flaw detection features.

The ultrasonic flaw detector also features an in-depth data filing system and multiple onboard reporting tools that allow users to effortlessly gather and report high-quality inspection data. It has a sturdy, ergonomic design that allows it to be used in almost any inspection setting, whereas the flexible PerfectSquare™ pulser combined with the maximum number of digital filters in its class can deal with virtually any application.

The EPOCH 650 digital ultrasonic flaw detector also incorporates Olympus’ industry-leading traditional law detection capabilities along with the efficiency of an extremely portable, intuitive instrument.

The combination of direct access keys and efficient menus in the EPOCH 650 flaw detector enables users to leverage the highest quality flaw detection platform with remarkable ease of use.

Designed for All Inspection Environments

The EPOCH 650 ultrasonic flaw detector has been developed for use in almost all inspection settings, right from bench-top testing in laboratory settings to hazardous and extreme outdoor conditions.

The EPOCH 650 instrument has been developed for IP rating in either navigation pad (IP67) or knob (IP66) configurations and tested to very high reliability and environmental standards. It enables users in any inspection setting to feel confident in terms of the durability and performance of the instrument.

Key Features

  • Digital high dynamic range receiver
  • Full-screen A-scan mode
  • PerfectSquare™ tunable square wave pulser
  • Developed to fulfill the EN12668-1 requirements
  • Navigation pad or knob adjustment configurations
  • Features 2 kHz PRF for quick scanning
  • Features 30 digital filters to deliver improved signal-to-noise ratio
  • Standard dynamic DAC/TCG as well as onboard DGS/AVG
  • More than 15 hours of battery life
  • Large, full VGA sunlight-readable display
  • MicroSD memory card is included for data transfers
  • Multiple on-board report formats
  • VGA and alarm outputs
  • USB On-The-Go (OTG) for PC communication
  • Optional analog output
  • Optional Corrosion Module software with Encoded B-scan

Simple and Comfortable Operation

The design of the EPOCH 650 ultrasonic flaw detector is meant to provide a very high level of flaw detection with the ease of a basic instrument. The detector has also been designed to be intuitive, ergonomic, and practical for both novice and experienced ultrasonic inspectors.

EPOCH 650 DGS/AVG feature—Standard Screen mode.

EPOCH 650 DGS/AVG feature—Standard Screen mode. Image Credit: Olympus Scientific Solutions Americas – Industrial Microscopy

Intuitive User Interface

The user interface in the EPOCH 650 ultrasonic flaw detector is built on the industry-leading EPOCH 600 flaw detector. The EPOCH 650 instrument integrates an easy menu structure for calibration, instrument settings, and software feature adjustment, with the EPOCH brand’s hallmark direct-access key method for crucial inspection functions, like screen freeze, gain and gate adjustment, and file save.

The EPOCH 650 user interface is supported in multiple languages and is intuitive for all levels of operators.

Vibrant VGA Display with Full-Screen Mode

The EPOCH 650 ultrasonic flaw detector features a large, full VGA (640 x 480 pixels) resolution display. It has a horizontal design that improves the size and readability of A-scan on this high-quality display.

Integrated with transflective technology, the VGA display offers exceptional clarity even in indoor, low-lighting conditions using its robust backlight, and also in direct sunlight by utilizing the ambient light as a pseudo-backlight.

EPOCH 650 DGS/AVG feature—Full-Screen mode.

EPOCH 650 DGS/AVG feature—Full-Screen mode. Image Credit: Olympus Scientific Solutions Americas – Industrial Microscopy

The full-screen mode feature enhances this striking display to offer the largest A-scan in an EPOCH series flaw detector.

Options for Comfortable Navigation

The EPOCH 650 ultrasonic flaw detector is available in two hardware configurations to accommodate the different needs and preferences of users. The hardware configurations include the following:

Knob

The adjustment knob provided on the EPOCH 650 ultrasonic flaw detector is used together with the ESC and CHECK keys to tune parameter values in either fine or coarse increments. Users can lock the adjustment knob to avoid accidental parameter value variations during an inspection.

A configuration like this offers smooth value slewing for customers who wish to adjust the parameters through a knob. The knob configuration has been developed to fulfill the IP66 requirements.

the EPOCH 650 Ultrasonic Flaw Detector

Image Credit: Olympus Scientific Solutions Americas – Industrial Microscopy

Navigation Pad

The navigation pad provided on the EPOCH 650 is a hallmark feature of the EPOCH flaw detectors. This navigation pad features up and down arrows that are used to adjust coarse parameters, while the right and left arrows are used for fine adjustments.

In addition, the navigation pad includes additional functions and frequently used parameters, like gain, save, and the ESC and CHECK keys. The configuration of the navigation pad has been designed to fulfill the IP67 requirements.

Physical Features—Rear

  • A – USB On-The-Go port
  • B – MicroSD card
  • C – DC power connector
  • D – VGA port
  • E – Digital I/O port
  • F – Transducer connectors (2)
  • G – Battery door
  • H – Pipe stand

the EPOCH 650 Ultrasonic Flaw Detector

Image Credit: Olympus Scientific Solutions Americas – Industrial Microscopy

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