The EID software package comes with an option of Elemental Mapping and Line Scan function. Elemental mapping shows the distribution of elements within the sample. The
prior selected elements for the spot analysis can be mapped at a user-specified acquisition time and pixel
resolution. The real-time mapping algorithm displays live build-up of the preferred element maps while
storing spectra of each pixel. This enables elements to be removed or added at any time during or after the mapping process.
Line Scan allows analysis over a selected line and mapping can be performed on the image as a whole. Selected Area option can also be added
to save time. Moreover, results can be easily exported and reported through an automated template.
The main features of the Elemental
Mapping and Line Scan are:
- Fast and reliable data on the distribution of elements within the sample or the selected line
- Mapping can be performed on the image as a whole
- Selected Area option saves valuable time
- Results can be easily exported and reported through an automated template