Measuring Al Coatings with X-Ray Fluorescence [XRF]
Aluminum can be used to create durable, highly reflective coatings for both light and heat as well as coatings for semiconductor, protective and decorative applications. The use of X-ray Fluorescence is well known for the non-destructive, non-contact measurement of metal and metal oxide coatings. Typically, XRF coating measurements rely on the high energy of the fluoresced X-rays generated within the coating to measure the thickness of the coating. Paradoxically, the Al(K) line at 1.486 keV is rather weak for XRF coating measurements.
This webinar will describe measurement methods for aluminum coatings which allow coating measurements beyond the directly excited range using the EDAX SMX XRF analyzer.
Dr. Bruce Scruggs
Product Manager, XRF
Bruce is the XRF Product Manager at EDAX and he has been involved with XRF for over 17 years since joining EDAX. Bruce holds an undergraduate degree in Chemistry from Valparaiso University and graduate degrees in Chemical Engineering from the Massachusetts Institute of Technology. He started out working in applications for a company which builds innovative sample handling equipment for solid-state NMR. Bruce got involved in XRF when a headhunter confused RF radiation with X-ray radiation and the rest is history.
While at EDAX, Bruce has also been the Product Manager for Service working to improve the quality of service and speed of response time.