With the advances in energy dispersive spectrometry (EDS) detectors, the technology has moved from single point-and-shoot spectrum collection to complete X-ray imaging. In times past the output of the data collection was simply an image but modern systems have a full spectrum associated with each individual pixel in the image. This allows us to do a significant amount of post processing of both the spectra and images to bring out the details, correlate elemental distributions, and locate small contributions not easily visible in the sum spectra.
In this webinar we will be taking a look at how different microscope settings affect map output and quality under high vacuum and variable pressure conditions and what information can be gained by varying these settings. Based on several examples, we will go through the various map types that can be calculated based on the raw data and discuss the difference between them. We will also cover some of the various options for extracting data from the maps in order to access information that is not obvious or accessible at first glance.
If you attend this webinar you will:
- Gain insight into the experimental parameters to consider when optimizing the SEM for EDS mapping.
- Learn about the strengths and weaknesses of the different ways of visualizing elemental distributions in a sample.
- Get the most out of your data collection by knowing the post-processing tools available.
Speaker
Jens Rafaelsen
Applications Engineer
EDAX
Jens Rafaelsen joined EDAX in 2014 as an Applications Engineer specializing in EDS. He has a strong background in electron microscopy and has trained numerous students and clients in SEM and EDS theory and practice. His experience includes several years as the technical supervisor of the clean room facilities at Aalborg University, Denmark, where he applied a variety of techniques including SEM, FIB, CVD, PVD, PES, AFM, laser spectroscopy, and optical, electron, and ion beam lithography.
Jens earned his PhD in Physics from Aalborg University. His research focused on Germanium surfaces and nanostructures probed by non-linear optical measurement techniques, photoemission spectroscopy, and electron microscopy.
As an Applications Engineer, Jens enjoys the versatility the position has to offer, ranging from training first time users and running reference samples to discussing applications with experts in the field and developing new techniques to solve complex problems. He is highly interested in novel applications, expanding the areas in which EDS is traditionally used, and ensuring users and clients receive the training and information they need to solve their daily tasks and make the most of their equipment.