Posted in | Microscopy

How to Optimize Backgrounds for EBSD Analysis on Multiphase Samples Using OIM Analysis™ v8?


Getting a good background on multiphase samples can be tricky. Intensity can vary between the phases by enough to cause oversaturation in one phase and undersaturation in another. This can cause issues with band detection and pattern indexing. A different approach is needed to overcome this challenge.

Post Processing Background options in OIM Analysis v8 now allow users to pick a background on any partitionable value to help them get the best results from the data. The same holds true for other indexing parameters such as Hough Setting. This webinar will explain how to make and use these backgrounds in OIM Analysis v8.


Shawn Wallace
Applications Specialist

Shawn Wallace joined EDAX in 2015 as an Applications Engineer specializing in EBSD. He has a strong background in all sorts of instrumentations including EBSD, electron microprobe, all sorts of mass spectrometry, and computed tomography. In his career, he has taught researchers of all levels, from post docs to undergrads, how to use instrumentation and he continues that here at EDAX.

Shawn earned his MS in Geology from the University of South Carolina. His research focused on method development for ICP-Mass spectrometry and geothermobarometry to help better understand planetary differentiation. After earning his degree, Shawn worked as a Scientific Assistant at the American Museum of Natural History in New York City, where he helped study the origin of the Solar System using EBSD and other instruments, including 3D work with computed tomography. Shawn hopes to bring those 3D skills to the rapidly expanding 3D EBSD world.

When Shawn is not busy running samples, he can often be found in nature, either hiking or fishing or just staring at rocks.

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