Copley Scientific to Exhibit Latest Equipment for Aerosol Sampling and Particle Characterisation Equipment

At this year's International Aerosol Conference in Helsinki, Copley Scientific will exhibit the latest equipment for aerosol sampling and particle characterisation, including the extended capabilities of the Wide-Range Particle Spectrometer (WPS) from MSP Corporation. The conference takes place from 29 August - 3 September 2010, at the University of Helsinki in Finland.

The WPS is the only commercially available spectrometer that combines differential mobility analysis (DMA) and condensation particle counting with laser light scattering in a single instrument. Now, it delivers a measurement range that extends from 10 microns to 5 nm and incorporates an electrical ioniser to neutralise particle charge prior to DMA, eliminating the need for neutralisation by radioactive source.

Thanks to its wide measurement range, the WPS is applicable across a variety of situations. It is ideal for: atmospheric aerosol measurement; indoor air quality studies, characterising emission sources; laboratory aerosol research; particle characterisation for semiconductor, computer disc drive and micro-contamination studies; and aerosol characterisation for atomisers, nebulisers and other drug delivery and medical devices.

The International Aerosol Conference is the world's largest conference dedicated to aerosol science and technology covering topics from nanomaterials to the global climate.

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