PANalytical Offers Free Webinar on X-ray Diffraction Reciprocal Space Mapping

PANalytical, the world’s leading supplier of analytical instrumentation and software for X-ray and related techniques, organizes a free webinar on June 05.

The webinar “What X-ray diffraction reciprocal space mapping tells you about your material”, will be presented by Lars Grieger, Application Specialist XRD, PANalytical B.V., the Netherlands.

Register here

This webinar focuses on data collection strategies and interpretation of reciprocal space maps from epitaxial layers. A walk through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies.

The state-of-the-art 2D detectors allowing faster data collection expands the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.

Webinar details

• Title: What X-ray diffraction reciprocal space mapping tells you about your material
• Date: Thursday 05 June 2014
• Time: 10:00 AM EDT (4:00 PM CET)
• Duration: 45 minutes
• Presenter: Lars Grieger, Application Specialist XRD, PANalytical B.V., the Netherlands

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For more information on PANalytical’ scheduled webinars see www.panalytical.com/webinars or read more about their solutions for thin films on www.panalytical.com/Thin-film-metrology.htm