Bruker X-Ray Analysis designs and manufactures analytical X-ray systems for elemental analysis, materials research, and structural investigations. Our innovative solutions enable a wide range of customers in heavy industry, chemistry, pharmacy, semiconductor, life science, and nanotechnology to make technological advancements and to accelerate their progress.
The Bruker X-Ray Analysis product range can be broadly grouped into the following classifications:
X-Ray Diffraction (XRD) is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells, and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization, and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, texture and residual stress investigations, controlled sample environment, micro-diffraction, nano-materials, lab- and process automation, and high-throughput polymorph screening.
Bruker is the worldwide leading supplier for advanced X-ray diffraction solutions. Continual innovation in X-ray sources, x-ray optics, x-ray detectors, x-ray powder diffraction software, and sample handling ensures that Bruker is able to offer a Diffraction Solution for virtually any kind of X-ray analytical task. In addition, the Bruker XRD systems are all built on the common D8 platform, which ensures modularity for future upgrades or downgrades of the system. For conditioning the incident beam, a wide range of interchangeable optics is available.
Sample Handling is Virtually Unlimited
Sample spinners, temperature, and humidity chambers, 5-degree of freedom motion control, or 300 mm automated wafer handling is all available on the D8 platform. On the detector side, point, 1-dimensional, and 2-dimensional XRD2 detectors can be optimized for the analytical task at hand. The DIFFRACplus and the DIFFRAC.SUITE software provides a common look and feel for measurement and analysis software. Amongst them is leading-edge technology, like DIFFRACplus TOPAS, the latest generation Total Pattern Analysis Rietveld software. Expert and professional applications, sales, training, and service are in place to support the customer.