LOT Oriel Release New Spectroscopic Ellipsometer for Photovoltaic and Flat Panel Display Applications

Characterizing thin film uniformity of large panels just got easier. LOT Oriel launched the AccuMap-SE® combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large areas.

Gain confidence about your coatings that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the M-2000 is well suited to all thin films in photovoltaic and flat panel display applications. Map uniformity of film thickness and optical constants for a wide range of coatings:

  • Amorphous, Microcrystalline and Polycrystalline Silicon
  • CIGS
  • CdTe/CdS
  • Transparent Conductive Oxides (ITO, SnO2:F, AZO...)

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