Applications of High-Speed CMOS Cameras for EBSD Micro-Structural Analysis Matt Nowell In this interview, Matt Nowell, the EBSD product manager at EDAX, talks to AZoM about applications of high-speed CMOS cameras for EBSD micro-structural analysis.
The Importance of Powder Characterization for Additive Manufacturing Eshaan Gandhi In this interview, AZoM talks to Eshaan Gandhi, Global Director of Manufacturing at Printerprezz, about the importance of powder characterization in additive manufacturing.
Flow Measurement of ‘Difficult’ Fluids Trevor Forster In this interview, AZoM talks to Trevor Foster, Managing Director of Titan Enterprises, about the flow measurement of "difficult" fluids.
AMERIGO - Nanoparticle and Zeta Potential AnalyzerThis page details the capabilities of the AMERIGO, Cordouan Technologies’ 3-in-1 advanced nanoparticle analyzer. From Cordouan Technologies
Vanta™ Element Handheld XRF Analyzer for Elemental AnalysisThis product profile describes the Vanta™ Element Handheld XRF Analyzer for Elemental Analysis from Olympus. From Olympus Scientific Solutions Americas NDT
Dimension XR Scanning Probe Microscopes: Featuring AFM with nanoDMAThe Dimension XR SPM has several configurations for advanced research in nanomechanical, nanoelectrical, and nanoelectrochemical characterization. From Bruker Nano Surfaces
Atomic Layer Deposition from Picosun: Shine and Surface Protection for Coins and Watches From Picosun Oy 3 Oct 2014