The LFA 467 HT HyperFlash® is based on the already-established LFA 467 HyperFlash® technology and requires no laser class due to the innovative light source system. The long lifetime of the xenon lamp provides cost-effective measurements above 1250°C without costly consumables.
ZoomOptics – For precise measurement results by an optimized field of view
The patented ZoomOptics system (patent no.: DE 10 2012 106 955 B4 2014.04.03) optimizes the field of view of the detector, thus eliminating any influences caused by aperture stops. The result is a significant increase in the precision of the measurement results.
Ultra-fast sampling rate (up to 2 MHz) and extremely short pulse widths (up to 20 µs) enabling measurement of thin and highly conducting materials
The data acquisition rate of the LFA 467 HyperFlash® series was increased to 2 MHz. This acquisition rate applies to both the IR detector and the pulse mapping channels. Thereby, highly conductive and/or thin materials requiring very short test times can be reliably tested.
When testing metal (0.3 mm) and polymer foils(30 µm), an optimum sampling rate and pulse width can be selected. The patented pulse mapping system accounts for the finite pulse width effect and heat losses (patent no.: US7038209 B2; US20040079886; DE1024241).
NETZSCH_LFA467 Líght Flash Instrument from NETZSCH Analyzing & Testing on Vimeo.