Better XRD Data Quality, Analysis & Interpretation (Cibinong)

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Organiser: Malvern Panalytical Better XRD Data Quality, Analysis & Interpretation (Cibinong)
Location: LIPI Cibinong, Jl. Raya Bogor Km. 46, Cibinong, Bogor, Indonesia, 16911
Dates: February 24-25, 2020

X-ray diffraction has undoubtedly been integral towards materials science research. We want to gather the XRD community to share knowledge and gain ideas on how to improve materials research. For the upcoming series of Malvern Panalytical’s XRD workshops across the Asia Pacific region, we have invited our leading specialist, Dr Daniel Lee, to share his knowledge.

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We will be organizing this workshop series in Surabaya, Indonesia. For more details, click here

Summary

  • Date: February 24 2020 - February 25 2020
  • Time: 09:00 - 17:00 (GMT+07:00) Asia South East
  • Country: Indonesia
  • Location: LIPI Cibinong, Jl. Raya Bogor Km. 46, Cibinong, Bogor, Indonesia, 16911
  • Event type: Seminar
  • Language: English

Agenda

Day 1 Program

  • 09.00 - 10.30 Introduction to powder X-ray diffraction: from the theory of Braggs law through to the physics of the X-ray diffractometer
  • 10.30 - 10.45 Coffee / Tea break
  • 10.45 - 11.15 How to collect good quality data: sample preparation for powder sample
  • 11.15 -  11.45 Demo: Running samples on the Aeris compact XRD
  • 11.45 - 12.30 Analysis of sample using Malvern Panalytical's HighScore Plus software *hands-on with your laptop*
    • Navigating around the software
    • Phase identification tutorial
  • 12.30 - 13.15 Lunch
  • 13.15 - 13.45 Hands-on with Aeris: learn how to operate the Aeris XRD to collect data
    • Audience sample 1
    • Audience sample 2
  • 13.45 - 14.15 Practical exercise: knowing the difference between good and bad data
  • 14.15 - 14.30 Improving your phase search mapping by defining your elemental range: introduction to elemental analysis using X-ray fluorescence
  • 14.30 - 15.15 Phase identification using HighScore Plus based on audience samples 1 & 2
  • 15.15 - 15.30 Coffee / Tea break
  • 15.30 - 16.00 Opportunity for hands-on with Aeris
  • 16.00 - 16.15 Recap and questions
  • 16.15 - 17.00 One-on-one sessions with Dr Daniel Lee (book your time slot)
  • 17.00 End

Day 2 Program

  • 09.00 - 09.45 XRD applications for powders including additive manufacturing, catalysts and launch of the market's intelligent X-ray diffractometer for handling multiple sample types without manual intervention of optics
  • 09.45 - 10.15 Recap of day 1's phase identification tutorial examples
  • 10.15 - 11.00 Hands-on with Aeris for data collection
    • Audience sample 3
    • Audience sample 4
  • 11.00 - 11.15 Coffee / Tea break
  • 11.15 - 12.00 Hands-on with HighScore software for data analysis: Phase quantification (using tutorial example)
  • 12.00 - 13.00 Lunch
  • 13.00 - 14.00 Phase quantification based on audience samples 3 & 4
  • 14.00 - 14.45 Rietveld refinement analysis
  • 14.45 - 15.00 Questions and answer
  • 15.00 - 15.15 Coffee / Tea break
  • 15.15 - 17.00 One-on-one sessions with Dr Daniel Lee (30min time slots available for booking)
  • 17.00 End

* Each attendee will be given a FREE 90-day trial version of the software.

Attendees are requested to bring their own laptop for this segment. Please note that HighScore is compatible only with Microsoft Windows (not MAC supported).

Speakers

About Dr Daniel Lee, XRD Application Specialist from Malvern Panalytical Korea's Application Laboratory

Dr Lee studied Material Science in Kyonggi University, South Korea. His areas of expertise are in powder diffraction, PVD, thin film analysis, phosphors, solar cells, lithium ion batteries and thin-flim batteries. Prior to joining Malvern Panalytical in 2013, he had taken on various positions involving energy storage research. He was the Senior Researcher at GS Nanotech for thin film lithium ion batteries (all-solid-state) as well as the Assistant Researcher at Telio Solar Korea's R & D department for CIGS solar cell development.

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