The F1-GIF™ System integrates high-resolution EELS, direct detection, and multidimensional analysis to deliver comprehensive chemical and structural characterization.
With materials science becoming increasingly complex, researchers no longer need to compromise among range, resolution, dose, or operational efficiency.
Engineered for scientists pushing the limits of discovery, the F1-GIF™ System provides comprehensive chemical and structural understanding within a unified electron energy-loss spectroscopy (EELS) platform, expediting groundbreaking investigations and fostering an uncompromised new era in materials science.
Advantages
- Achieves concurrent range and resolution without concessions: Acquires extensive energy ranges and precise spectral features in a single measurement, removing the necessity to select between coverage and accuracy.
- Uncovers the entire elemental composition: Distinguishes multiple edges with the requisite clarity for reliable chemical identification in intricate, multi-element substances.
- Functions smoothly across various accelerating voltages: Employs a single large-format direct-detection system for both low- and high-kV analysis, spanning 30 to 300 kV.
- Faster results with reduced sample degradation: Leverages direct detection and dose fractionation techniques to gather swift frames, aggregate signals, rectify drift, and safeguard delicate samples.
- Integrated, multi-dimensional analysis: Connects EELS data with 4D STEM to enable a 5D STEM workflow that links composition, chemical state, structure, orientation, strain, and local potential.