Better XRD Data Quality, Analysis & Interpretation (Surabaya)

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Organiser: Malvern Panalytical Better XRD Data Quality, Analysis & Interpretation (Surabaya)
Location: LIPI Cibinong, Surabaya, Indonesia
Dates: February 27-28, 2020

X-ray diffraction has undoubtedly been integral towards materials science research. We want to gather the XRD community to share knowledge and gain ideas on how to improve materials research. For the upcoming series of Malvern Panalytical’s XRD workshops across the Asia Pacific region, we have invited our leading specialist, Dr Daniel Lee, to share his knowledge.

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We will be organizing this workshop series in Cibinong, Indonesia. For more details, click here

Summary

  • Date: February 27 2020 - February 28 2020
  • Time: 09:00 - 17:00 (GMT+07:00) Asia South East
  • Country: Indonesia
  • Location: LIPI Cibinong, Surabaya, Indonesia
  • Event type: Seminar
  • Language: English

Agenda

Day 1 Program

  • 09.00 - 10.30 Introduction to powder X-ray diffraction: from the theory of Braggs law through to the physics of the X-ray diffractometer
  • 10.30 - 10.45 Coffee / Tea break
  • 10.45 - 11.15 How to collect good quality data: sample preparation for powder sample
  • 11.15 - 12.00 How to record good data: considerations
    • Analysis time, step size, slits, spinning, binning multiple data sets together, signal to noise, how bad smoothing is
  • 12.00 - 13.00 Lunch
  • 13.00 - 13.30 Data analysis: knowing the difference between good and bad data
  • 13.30 - 14.15 Introduction to Malvern Panalytical's HighScore Plus software for XRD analysis
  • 14.15 - 15.00 Phase identification
  • 15.00 - 15.15 Coffee / Tea break
  • 15.15 -16.30 Phase identification tutorial examples continued
  • 16.30 - 16.45 Recap and questions
  • 16.45 - 17.00 One-on-one sessions with Dr Daniel Lee (book your time slot)
  • 17.00 End

Day 2 Program

  • 09.00 - 09.30 Recap of day 1's phase identification tutorial examples
  • 09.30 - 10.15 XRD applications for powders including additive manufacturing, catalysts
  • 10.15 - 11.00 Data analysis using HighScore Plus for determining crystallite size
  • 11.00 - 11.15 Coffee / Tea break
  • 11.15 - 12.00 Data analysis continued: Phase quantification
  • 12.00 - 13.00 Lunch
  • 13.00 - 14.00 Recap on earlier tutorials on phase quantification and crystallite size
  • 14.00 - 14.45 Rietveld refinement analysis
  • 14.45 - 15.00 Coffee / Tea break
  • 15.00 - 15.45 Advanced XRD applications for thin films and coatings
  • 15.45 - 16.15 Advanced XRD applications for battery research
  • 16.15 - 16.30 Questions and answer
  • 16.30 - 17.00 One-on-one sessions with Dr Daniel Lee (15min time slots available for booking)
  • 17.00 End

* Each attendee will be given a free trial version of the software. Attendees are requested to bring their own laptop for this segment. Please note that HighScore is compatible only with Microsoft Windows.

Speakers

About Dr Daniel Lee, XRD Application Specialist from Malvern Panalytical Korea's Application Laboratory

Dr Lee studied Material Science in Kyonggi University, South Korea. His areas of expertise are in powder diffraction, PVD, thin film analysis, phosphors, solar cells, lithium ion batteries and thin-flim batteries. Prior to jioining Malvern Panalytical in 2013, he had taken on various positions involving energy storage research. He was the Senior Researcher at GS Nanotech for thin film lithium ion batteries (all-solid-state) as well as the Assistant Researcher at Telio Solar Korea's R +amp;amp; D department for CIGS solar cell development.

More Information

*Complimentary entry upon registration*

Benefit from our full day interactive learning workshop

  • Learn the basics of powder XRD
  • Pick up tips on how to properly prepare your samples, ensure optimized measurement conditions and good data quality
  • Learn how to perform phase ID on our HighScore software
  • Gain confidence in advanced XRD analysis using Rietveld Refinement

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