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SciAps Launch Inspector Scope Handheld Raman Analyzer

SciAps, a Woburn, MA based portable analytical instrumentation company, is pleased to announce the Inspector Scope. The Scope integrates our state-of-the art handheld Raman analyzer with a microscope and XYZ stage.

From SciAps, Inc. 14 Aug 2013

Asian Memory Manufacturer Places Order for Nova's Optical CD Metrology Solution

Nova Measuring Instruments Ltd. provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, announced today that a leading Asian memory manufacturer placed a first time order for Nova's Optical CD metrology solution.

14 Aug 2013

Lake Shore to Exhibit Materials Characterization Systems at ICNS 2013

Lake Shore offers probe stations, Hall measurement systems (HMS) and a prototype THz system that allows for complex measurements under variable temperature and magnetic field conditions.

From Lake Shore Cryotronics Inc. 13 Aug 2013

MTS Partners with German-Dutch Wind Tunnels to Deliver World’s Largest Rolling Road System

MTS Systems Corporation, a leading global supplier of high performance test systems and position sensors, today announced that the world’s largest rolling road system is now fully operational at DNW (German-Dutch Wind Tunnels), one of the world’s most advanced specialized wind tunnel test facilities, located 100 kilometers northeast of Amsterdam, the Netherlands.

13 Aug 2013

Nanometrics’ Atlas II Platform for OCD Metrology Helps SK hynix Improve Memory Device Production

Nanometrics Incorporated, a leading provider of advanced process control metrology and inspection systems, today announced that SK hynix has realized significant process control improvement by deploying the Atlas® II platform for optical critical dimension (OCD) metrology across its memory device production.

13 Aug 2013

DoE's HSSL Virtual Nuclear Control Room Aids Duke Energy Project

Modernizing nuclear power plants to help extend their operating lifetimes is no small task. But the endeavor offers an opportunity to improve control-room design and layout.

9 Aug 2013

A New Standard in Micro Hardness Testers from Shimadzu

Operator error continues to be a concern in quality control testing where reliable measurements are essential. Shimadzu’s new HMV-G Series of Micro Vickers hardness testers provides an operator-friendly, cost-effec...

From Shimadzu Scientific Instruments 7 Aug 2013

TechSearch International President to Keynote at Cascade Microtech's COMPASS 2013 Conference

Cascade Microtech, Inc., a leader at enabling precision measurements of integrated circuits at the wafer level, today announced that E. Jan Vardaman, President and Founder of TechSearch International, Inc. will be featured as keynote speaker at Cascade Microtech's first annual Users' Conference, COMPASS 2013.

7 Aug 2013

New Low Cost, Long Pulsed SpectraLEDs from HORIBA Scientific

HORIBA Scientific, global leader in fluorescence spectroscopy systems, announces a new series of SpectraLEDs for phosphorescence measurements. The new SpectraLEDs, unique to HORIBA Scientific, are low cost, long pulse...

From HORIBA 6 Aug 2013

Zwick to Highlight X-Flow Series at K Show in Dusseldorf

Zwick/Roell, a leading worldwide supplier of materials testing systems for the plastics industry will be exhibiting at the K Show in Dusseldorf October 16 through 23 at Messe Dusseldorf, Halls 1 to 7. Zwick Xflow extrus...

From ZwickRoell GmbH Co. KG 6 Aug 2013

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