Posted in | Materials Testing and Characterisation

SWIR Semiconductor Inspection

Discover how SWIR (Short-Wave Infrared) imaging improves semiconductor inspection by revealing features hidden from visible cameras. This video demonstrates how InGaAs SWIR cameras image through silicon wafers to detect cracks, voids, alignment marks, bonded interfaces, and other defects critical to semiconductor manufacturing and failure analysis. SWIR imaging provides higher contrast for silicon inspection, wafer analysis, die inspection, packaging inspection, and process monitoring, helping improve yield and quality control. Pembroke Instruments supplies high-performance SWIR cameras for machine vision, scientific imaging, and semiconductor inspection.

Run time: 1.27 min

SWIR Semiconductor Inspection Pembroke Instruments

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