Pittcon 2009 Interviews

The PANalytical XPert Pro Multi Purpose X-Ray Diffraction System (XRD)

PANalytical's Brian Litteer takes us for a tour of their brand new XPert Pro MPD (multi purpose diffractometer) or x-ray diffraction (XRD) system that is suited to industrial and academic materials analysis applications.

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Thermcraft eXPRESS Line Box Furnaces - Key Features

The eXPRESS Line furnaces from Thermcraft as so-named due to their short 2 week lead time to be manufactured. Jim Miller points out the key features and options of the box furnace range.

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The Particle Insight Particle Shape Analyzer from Micromeritics

Peter Bouza from Micromeritics demonstrates the Particle Insight particle shape analyzer. It is a dynamic instrument that uses flow through image analysis.

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The Morphologi G3 Particle Characterization System - Features and Demonstration

Janie Dubois from Malvern Instruments takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.

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The Gemini VII Surface Area and Porosity Measurement Tool from Micromeritics

Mike Gilley from Micromeritics shows us the Gemini VII tat is being shown at Pittcon 2009 for the first time. The Gemini VII is a surface area and porosity measurement instrument.

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The Hiden EQP Mass Spectrometer for Plasma Characterisation

Hiden Analytical's Mark Buckley explains the operation and capabilities of the Hiden EQP mass spectrometer which is used for plasma characterisation. It is typically used by process development engineers and research technicians to optimise plasma conditions for the manufacture and fabrication of new and novel devices.

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The JETVISC Kinematic Viscometer from Rheotek

Mike Fogarty from Rheotek introduces us to their JETVISC kinematic viscometer which has been designed for testing aviation fuels, diesel fuels, hydraulic fluids, transformer oils and other similar materials.

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The eXplorer Personal Scanning Electron Microscope (PSEM) from Aspex Corp

Aspex Corp's Tim Drake takes a few minutes to point out the the key features of their Personal Scanning Electron Microscope, PSEM eXplorer, which is an integrated SEM/EDX system designed for rapid automated particle analysis. Some of the main features include large sample chamber and silicon drift detector.

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The JEOL NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM)

Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.

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The Viscotek GPC/SEC System from Malvern Instruments - Features and Capabilities

Jason Sanchez from Malvern Panalytical tells us about the Viscotek Size exclusion gas chromatography system which is suited to all types of polymers, proteins, biopolymers etc.

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Advanced Ceramic Materials and Components Supplied by Ceramaret

Chris Farine from Ceramaret shows us some examples of some of the advanced ceramic components that they manufacture.

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The AXIOS X-Ray Fluorescence (XRF) Spectrometer from PANalytical

David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.

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The HPR20 Quadrupole Mass Spectrometer from Hiden Analytical

Mark Buckley from Hiden Analytical shows us through the gas sampling HPR20 Quadrupole Mass Spectrometer which is ideal for analysing gases from process lines.

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The Nanosight LM20 Nanoparticle Analysis System

Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system

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The Spectro Genesis ICP Spectrometer - Operation and Key Features

The Genesis ICP system from Spectro is a low cost, high throughput instrument that makes an ideal alternative to more expensive atomic absorption spectrometers. It is typically used in the oil, soil, environmental and metallurgical fields.

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The EDX Pocket III Handheld XRF Spectrometer from Skyray

This video provides a demonstration of the Skyray EDX Pocket III handheld XRF spectrometer. In this example, they test a cell phone casing to see if it complies with RoHS, hazardous materials requirements.

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AFM Users Contribute to Unique Market Study

In an exclusive interview carried out at Pittcon 2009, we speak with Barbara Foster from the Microscopy and Imaging Place or The MIP about the first ever global report on the AFM market place using feedback from AFM users themselves.

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Micro XRF (X-Ray Fluorescence) Product Range from Bruker XRD

Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments.

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The DVII+ Pro Viscometer from Brookfield Engineering

David Larson from Brookfield Engineering demonstrates the simple operation of the DVII+n Pro Viscometer, which is the latest version of their most popular instrument.

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Particle Characterization by Static and Dynamic Image Analysis by HORIBA

Mark Bumiller from HORIBA Particle Products introduces us to some particle characterization by static and dynamic image analysis and the HORIBA PSA300 and Camsizer. These instruments calculate particle size and shape distributions.

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The BX51 Materials Research Microscope from Olympus

Chris Vander Tuuk from Olympus Scientific Equipment shows us the BX51, which is their flagship materials research microscope.

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The Zetasizer Particle Sizing Range of Instruments from Malvern

Dave Dolak from Malvern Panalytical Instrument showcases their new Malvern Panalytical Zetasizer µV and Zetasizer APS, which are making the debut at Pittcon 2009. These instruments are dedicated batch dynamic light scattering instruments which feature the ultimate in sensitivity and use the lowerst sample volumes, as low as 2 microlitres.

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Tubular Ceramic Products from McDanel Advanced Ceramic Technology

Chris Rogowski from McDanel Advanced Ceramic Technology demonstrates their manufacturing capabilities. They specialize in tubular ceramic products ranging in size from just millimeters in diameter to over 300 mm, with single or multi-bore configurations manufactured using extrusion and slip casting.

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The Spectro Midex Micro XRF Spectrometer - Demonstration

Bob Burton gives us a demonstration of how easy to use the Spectro Midex Micro X-Ray Fluorescence (XRF) spectrometer is to use.

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The PolyVISC Automated Polymer Viscosity Testing System from Cannon Instruments

Ron Lutz from the Cannon Instrument Company introduces us to the PolyVISC system which is used by polymer and petrochemical companies in research and development and quality control applications.

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Thermcraft eXPRESS Line Split Tube Furnaces - Key Features

The eXPRESS Line furnaces from Thermcraft as so-named due to their short 2 week lead time to be manufactured. Jim Miller points out the key features and options of the split tube furnace range.

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The eXpress Personal Scanning Electron Microscope from Aspex Corp

Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.

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The alpha300 Raman/AFM/SNOM from WITec

WITec's Jo Koenen shows us through the various features and cpabilities of the alpha300 Raman/AFM/SNOM. The alpha300 features scanning probe as well as high resolution optical and Raman microscopes techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.

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The Linkam T95 Temperature Controller and 420 Thermal Stage for Microscopy

Jeff McGinn from McCrone introduces us to two new tools for microscopy from Linkam, the T95 Temperature Programmer on sow for the first time at Pittcon 2009 and the 420 thermal stage.

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The Bruker XRD S8 Lion XRF Spectrometer for the Cement Industry

Alexander Seyfarth from Bruker AXS introduces us to the S8 Lion, a new XRF unit designed specifically for the cement industry. This is the latest in the S8 series and features multi-channel analysis, which provides much faster analysis compared to sequential analysis instruments.

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The Olympus LEXT Laser Confocal Microscope

Chris Vander Tuuk then shows us through Olympus’ latest instrument, the LEXT laser confocal microscope. The LEXT features a 5 objective turret with objectives from 120 to 14400 times magnification. The standard stage has a travel of 150x150mm, but can be adapted to cater for 300mm wafers.

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