We are introduced to Park Systems new XE-100 series general purpose AFMs. Dr. Sang-il Park explains how the use of a x-y scanner and decoupled z scanner produces very flat scans and how their system can operate in a true non-contact mode to produce accurate, high resolution images, with excellent reproducibility. As well as topographical information, the XE-100 series AFMs can also measure electrical, magnetic, mechanical and optical properties of materials.
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