Jul 26 2010
UT-Battelle has appointed Michael K. Miller of the Department of Energy's Oak Ridge National Laboratory a UT-Battelle Corporate Fellow.
The honor is reserved as the highest level of recognition for career achievements in science and technology, performance and leadership.
Miller, of ORNL's Materials Science and Technology Division, is recognized as one of the premier scientific leaders in the field of atom probe ion microscopy and atom probe tomography. He has pioneered the application of these techniques to a broad range of materials, statistical data, analysis methods and new instrument design.
"Mike's research achievements in the field of microscopy have bolstered ORNL's capabilities in advanced materials analysis, which is vital to solving the nation's energy challenge," said ORNL Director Thom Mason.
During his 26-year tenure at ORNL, Miller has established himself as the preeminent researcher in field-ion and atom microscopy. He is currently leading ORNL's fundamental experimental efforts to understand and exploit the unprecedented properties and behaviors of nanostructured ferritic stainless steels.
Miller's scientific impact is demonstrated not only by his ongoing research and development accomplishments, but also by his contributions to the continued success of the Shared Research Equipment (SHaRE) User program at ORNL. His work attracts atom probe users from domestic and international universities, industry and other national laboratories, helping to make the SHaRE atom probe facility into the leading laboratory of its kind.
Miller has authored or co-authored more than 460 publications in peer-reviewed journals, written three books and has made more than 730 presentations, of which 125 were invited. He has been honored with several major awards, including the Coslett Award in 2004 from the Microbeam Analysis Society and the Prince Hassan Medal for Scientific Contributions at the International Level in 1998.
Most recently, Miller, a resident of Oak Ridge, was recognized as a 2009 Fellow of The Minerals, Metals and Materials Society (TMS) and as a 2010 Fellow of the Microscopy Society of America.
Source: http://www.ornl.gov/