Dec 28 2010
Ceram, a global expert in materials testing, analysis and consultancy, has extended the scope of its microstructural and mineralogical analysis services with the acquisition of a new X-Ray Diffractometer (XRD).
The state-of-the-art XRD system provides faster analysis turnaround, increased resolution, non-powder sample analysis and improved Rietveld refinement, as well as three new techniques: X-Ray Reflectivity (XRR); Grazing Incidence XRD (GIXRD); and Micro-Diffraction (µ-XRD).
XRD provides detailed information on the crystallographic structure, chemical composition and physical properties of materials and thin films. The technique uniquely produces phase identification, phase quantification, degree of crystallinity, crystallite size and unit cell size. The new system will enable Ceram’s clients to understand crystal structures within materials that often control performance properties through mineralogical assemblages and detailed structure; these often prove to be critical. XRD has many applications, including coated glasses, polymers, silicon wafers, solar cells, filters, catalyst carriers, corroded products and liquid crystal displays.
Dr Richard White, Head of Testing at Ceram, comments: “The combination of our highly experienced and skilled team and the new X-Ray Diffraction system will allow us to offer our clients an unparalleled resource for evaluating crystal and mineral structures to much greater depths.”
Ceram has also recently invested in a new Fourier Transform Infrared (FTIR) system which provides identification of compounds and chemical functionality in the near-surface region of materials. The new system will form a critical part of Ceram’s problem-solving capability, which already includes SEM, DSIMS, ToF-SIMS, XPS and 3DP.
Source: http://www.ceram.com/