Solving RF Variation in Extractables and Leachables Analysis Dr. Mark Jordi AZoM spoke to Dr. Mark Jordi about extractables and leachables analysis and solving the issues caused by response factor (RF) variation.
A Legacy of Microscopy Sophia Antonioli-Schmit In this interview, AZoM talks to Sophia Antonioli-Schmit, a student researcher at the National Health Institute’s RML, about her history with electron microscopy.
Deep Learning for Micrograph Analysis Dr. John Sosa In this interview, AZoM talks to Dr. John Sosa, CEO and Co-Founder of MIPAR Image Analysis, about micrograph analysis and deep learning.
Holey Film TEM Grids for Premier Sample SupportThe new holey film TEM grids from Protochips are a premier new product that will support samples. From Protochips
PRESTO W56—Single-Stage Dynamic Temperature Control SystemThe water-cooled Presto W56 powerful, single-stage dynamic temperature control system from Julabo can handle high-performance applications efficiently. From JULABO GMBH
Softening Point with DP Excellence from METTLER TOLEDODropping Point Systems like DP Excellence to measure the softening point or dropping point of many materials to determine their quality and purity. From Mettler-Toledo International Inc.
Chemical State Mapping of Polymers with XPS From Thermo Fisher Scientific – X-Ray Photoelectron Spectroscopy (XPS) 4 Jun 2020