Posted in | Materials Analysis

MRD XL Automation Package - SECS/GEM To Connect To Your Host

MRD XL Automation is the ideal solution for cleaner, quicker, and more efficient wafer analysis with your X’Pert³ MRD XL X-ray diffractometer for thin film metrology. By communicating closely with the host computer with the widely used SECS/GEM protocols, this MRD XL can be automatically controlled and efficiently managed throughout the research or production process – from initial wafer selection to results distribution.

With a fully customizable framework, the configuration of this software can be adapted to meet your needs. Thanks to the futureproofing provided by the MRD XL Automation software, this instrument is a great way to increase your analysis capabilities without needing to invest in new equipment.

During the webinar, we’ll demonstrate the capabilities of this new feature and guide you through the process of setting up new jobs and recipes, allowing you to fully automate and streamline the operation of an MRD XL.

Our Speakers

Tim Gorter

Product Manager, Malvern Panalytical

Biljana Spireva

Requirements Engineer, Malvern Panalytical

More Information

Who Should Attend?

Persons working for companies involved in the decisions making to buy X-ray diffractometer equipment. Most probably, these people work for semiconductor fabrication sites.

  • Metrology specialists
  • Fab operators
  • Equipment purchasers
  • Application specialists

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We are also running a later session for this event - please see more information here.

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