In this four-part masterclass series, Malvern Panalytical will explore method development and data interpretation for dynamic light scattering (DLS) and Zeta Potential with a deep dive into each area.
These masterclasses are designed for scientists and researchers interested in method development for DLS sizing measurements, as well as compliance officers seeking a deeper understanding of critical quality parameters.
Masterclass 1 discusses method development utilizing the Zetasizer Advance series for DLS sizing measurements, highlighting numerous considerations when creating a robust sizing measurement, including:
- Instrument verification
- Cell selection
- Sample preparation
- Measurement setup
- Result analysis
This session would be beneficial to anyone interested in exploring method development for DLS sizing measurements or who wants to better understand critical-to-quality parameters.
Masterclass 2 investigates method development for zeta potential measurements with the Zetasizer Advance series, highlighting various considerations when designing robust measurement procedures, including:
- Instrument verification
- Cell selection
- Sample preparation
- Measurement setup
- Result analysis
This session would benefit anyone interested in exploring method development for DLS sizing measurements or who wants to better understand critical-to-quality parameters.
Masterclass 3 examines the result and data interpretation of size measurements utilizing the Zetasizer Advance series, highlighting the key parameters and charts available in ZS Xplorer software to enable data interpretation, and how to configure the software to present them.
Malvern will also discuss how to identify good and poor data, understand why data could be poor, and what steps can be taken to improve it.
This session would benefit anyone interested in exploring method development for DLS sizing measurements or who wants to better understand critical-to-quality parameters.
Masterclass 4 will consider the result and data interpretation of zeta potential measurements utilizing the Zetasizer Advance series. It will highlight key parameters and charts available in ZS Xplorer software to enable interpretation, how to configure the software for better visualization, identify good vs. poor data, understand the causes of poor data, and explore ways to improve it.
This session would benefit anyone interested in exploring method development for DLS sizing measurements or who wants to better understand critical-to-quality parameters.
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