Analysis of Polypropylene Sealing Surfaces Using Atomic Force Microscopy AFM – ipolytech

Atomic Force Microscopy

AFM is a form of scanning probe microscopy. The AFM probe has a very sharp tip, at the end of a small cantilever beam. The probe is attached to a piezoelectric scanner tube, which scans the probe across a selected area of the sample surface. Interatomic forces between the probe tip and the sample surface cause the cantilever to deflect as the sample's surface topography (or other properties) changes. A laser light reflected from the back of the cantilever measures the deflection of the cantilever, and this information is fed back to a computer, which generates a map of topography and/or other properties of interest. Areas as large as about 100 microns square to less than 100 nm square can be imaged.

Comparison of Polypropylene Sealing Surface by AFM

Atomic force microscopy was used to compare the sealing surfaces of two components manufactured from different cavities within a multi cavity tool. One cavity produced poor seal quality whilst the other produced a good, consistent seal.

AFM images of the two surfaces are shown below:

Figure 1. AFM image from cavity showing good seal quality

Figure 2. AFM image from cavity showing poor seal quality

As can be seen from these images, whilst the component from the good cavity shows a relatively smooth surface, the cavity producing the poor seal quality has a rippled, undulating surface. This cavity, with a reduced tool temeprtaure produces stick/slip flow in the critical region of the sealing surface.

Source: ipolytech

For more information on this source, please visit ipolytech

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Independent Polymer Technology - Ipolytech. (2018, August 22). Analysis of Polypropylene Sealing Surfaces Using Atomic Force Microscopy AFM – ipolytech. AZoM. Retrieved on May 20, 2024 from https://www.azom.com/article.aspx?ArticleID=5312.

  • MLA

    Independent Polymer Technology - Ipolytech. "Analysis of Polypropylene Sealing Surfaces Using Atomic Force Microscopy AFM – ipolytech". AZoM. 20 May 2024. <https://www.azom.com/article.aspx?ArticleID=5312>.

  • Chicago

    Independent Polymer Technology - Ipolytech. "Analysis of Polypropylene Sealing Surfaces Using Atomic Force Microscopy AFM – ipolytech". AZoM. https://www.azom.com/article.aspx?ArticleID=5312. (accessed May 20, 2024).

  • Harvard

    Independent Polymer Technology - Ipolytech. 2018. Analysis of Polypropylene Sealing Surfaces Using Atomic Force Microscopy AFM – ipolytech. AZoM, viewed 20 May 2024, https://www.azom.com/article.aspx?ArticleID=5312.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this article?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.