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Extend the Capabilities of Your TEM with a DENSsolutions in situ TEM System

Extend the Capabilities of Your TEM with a DENSsolutions in situ TEM System

Researchers Develop New Class of Super-Hydrophobic Materials

Researchers Develop New Class of Super-Hydrophobic Materials

New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection

New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection

HORIBA Scientific Announces New Product Line Manager for Optical Spectroscopy Division

HORIBA Scientific Announces New Product Line Manager for Optical Spectroscopy Division

Free Webinar on Cement Analysis Using the Zetium XRF Spectrometer with THETA Free Lime Channel

Free Webinar on Cement Analysis Using the Zetium XRF Spectrometer with THETA Free Lime Channel

ABB introduces TALYS ASP400 series, a new refinery and petrochemical process analyzer

ABB introduces TALYS ASP400 series, a new refinery and petrochemical process analyzer

NETZSCH Launches New Academy Website Offering Free Know-How for the Analysis, Characterization and Identification of Materials

SPECTRO Release New White Paper on Overcoming Matrix Effects With XRF Analysis

PANalytical Announce Webinar on XRD for Earth Science

PANalytical Announce Webinar on XRD for Earth Science

CRAIC Technologies Offers Discounted Microspectroscopy Refresher Training Packages

CRAIC Technologies Offers Discounted Microspectroscopy Refresher Training Packages

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