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Oxford Instruments to Showcase MQC Benchtop NMR Analyzers at AOCS Annual Meeting

Oxford Instruments to Showcase MQC Benchtop NMR Analyzers at AOCS Annual Meeting

New Way to Characterize Wetting is Much More Accurate

New Way to Characterize Wetting is Much More Accurate

Bruker to Supply Large Sample AFM to NIST

Bruker to Supply Large Sample AFM to NIST

FEI Introduces A New High Resolution SEM

Nanometrics Delivers Metrology System for Semiconductor Wafer Manufacturer

EDXRF Provides Accuracy and Flexibility for Steel Producers

Keithley Release Tutorial CD on Electrical Test and Measurement

Fischer Instrumentation to Host Coating Thickness and Materials Analysis Seminar

Fischer Instrumentation to Host Coating Thickness and Materials Analysis Seminar

XYZ Piezo Stage for Micromanufacturing, Nanomanipulation and Microscopy

XYZ Piezo Stage for Micromanufacturing, Nanomanipulation and Microscopy

Micromeritics to Showcase Powder and Particle Characterization Systems at PTXi

Micromeritics to Showcase Powder and Particle Characterization Systems at PTXi

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