Appalachian State University's William C. and Ruth Ann Dewel Microscopy Facility has received a $509,620 award from the National Science Foundation to purchase a state-of-the-art transmission electron microscope/scan...
FEI Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and analysis systems, today announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated an...
Dr Graham Rideal, managing director of Whitehouse Scientific, will deliver a paper at Filtech 2009 describing ‘A new method of measuring pore size distributions using multi-modal particle size standards’. The work is being presented as part of the session on Filter Media Characterization and describes a novel technique developed by Graham Rideal and Jamie Storey of Whitehouse Scientific in collaboration with Dr B Schied of BS-Partikel in Germany.
Lambda Photometrics, one of the UK's leading distributors of Lasers, Optics, Fibre Optics, Electronic Instrumentation, Surface Metrology and Machine Vision products, introduce the Fibermetric System powered by the Phenom desktop SEM; a powerful, easy to use automated measurement system for nano and micro fibers.
Philosophers often say that to find the truth one must look below the surface. But for scientists and engineers in a broad range of fields, the surfaces of objects can reveal a wealth of useful information, from the func...
Asylum Research and the Masdar Institute of Science and Technology (Abu Dhabi, United Arab Emirates) announced today that the Institute's Laboratory for Energy and Nano-Science (LENS) has acquired Asylum's MFP-3D Stand Alone Atomic Force Microscope (AFM) and instrumented NanoIndenter to perform research aimed at improving the efficiency of thermoelectric materials and developing non-destructive tools for thin film characterization of photovoltaics.
CRAIC Technologies, the leading innovator of UV-visible-NIR microanalysis solutions for scientific laboratories, announces the Microspectra 121™ UV-visible-NIR microspectrophotometer. This system is specifically designed to rapidly, accurately and non-destructively analyze many types of microscopic samples by UV-visible-NIR spectroscopy.
Florida Rock Industries (Jacksonville, Florida, US), part of the Vulcan Materials Company, has slashed energy consumption and improved cement product quality using the powerful combination of a model predictive control package from Pavilion Technologies (Austin, Texas US) and real-time particle size analysis from Malvern Panalytical.
Lloyd Instruments has introduced a new test jig for peel strength testing of laminated layers of standard plastic identification cards to international standards. The use of plastic cards is reaching unprecedented levels, with at least one credit or debit card, driving licence, or loyalty or membership card being found in almost everyone’s wallet or purse.
The "Shuttle + Find" solution from Carl Zeiss for correlative microscopy in materials analysis is an easy-to-use interface. It connects upright and inverted light microscopes of type SteREO Discovery, Axio Imager and Axio Observer, featuring a motorized stage, with all ZEISS scanning electron microscopes such as EVO, SIGMA, SUPRA, ULTRA and MERLIN, as well as the CrossBeam (FIB-SEM) workstations AURIGA, NVision and NEON.
Terms
While we only use edited and approved content for Azthena
answers, it may on occasions provide incorrect responses.
Please confirm any data provided with the related suppliers or
authors. We do not provide medical advice, if you search for
medical information you must always consult a medical
professional before acting on any information provided.
Your questions, but not your email details will be shared with
OpenAI and retained for 30 days in accordance with their
privacy principles.
Please do not ask questions that use sensitive or confidential
information.
Read the full Terms & Conditions.