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SHHIC Deploys Advantest V93000 Smart Scale System for Parallel Testing of RFID Semiconductors

Leading semiconductor test equipment supplier Advantest Corporation has announced that Shanghai Huahong Integrated Circuit Co., Ltd. (SHHIC), a leading supplier of radio-frequency (RF) smart cards and information-security ICs, is the first chip maker to use Advantest's V93000 Smart ScaleTM generation tester in the low-cost Dragon configuration for highly parallel testing of RFID semiconductors.

31 Jul 2013

Chromasens Enhances allPIXA CCD Colour Line Scan Cameras

Chromasens is equipping its allPIXA CCD colour line scan camera with new functions for even greater comfort and performance as well as an application programming interface (API). Firmware version 1.3 supports onboard colourprocessing with up to 4 individual sets of high-performance colour conversion matrix (CCM) and offers a unique feature for internal camera keystone distortion compensation.

30 Jul 2013

Best Ultrasonic Wave Frequencies for Detection of Adhesive Failures can be Selected

Ultrasonic waves can find bubbles and cracks in adhesive bonds holding airplane composite parts together, and now aerospace engineers can select the best frequencies to detect adhesive failures in hard-to-reach places more quickly, thanks to Penn State researchers.

25 Jul 2013

New Battery and Energy Storage Technology Testing and Commercialization Center in Rochester

The New York Battery and Energy Storage Technology Consortium (NY-BEST) and DNV KEMA Energy & Sustainability, a leading global energy consultancy and authority in testing, inspection and certification, today outlined their new partnership whereby nearly $23 million will be invested to build and grow the new Battery and Energy Storage Technology (BEST) Testing and Commercialization Center in Rochester, New York.

25 Jul 2013

NIST Develops New Standard Reference Material for Calibration of Hospital CAT Scanners

Scientists at the National Institute of Standards and Technology (NIST) have developed a new standard reference material (SRM), the first such measurement tool to enable hospitals to link important tissue density measurements made by CAT scans to international standards.

25 Jul 2013

2013 R&D 100 Award Won By OlympusIX3 Inverted Microscopes

An Olympus inverted microscope series that represents a completely new approach to microscope design has been recognized as among the 100 most technologically significant products introduced last year. Olympus IX3 micros...

From Evident Corporation - NDT 23 Jul 2013

KMSA Launches Non-Contact In-Line System for Real-Time Analysis of Color

Konica Minolta Sensing Americas, Inc. (KMSA), the worldwide leader in the industrial measurement of color, light and 3D shape, announces the launch of its latest color measurement solution; the innovative NC-1 non-contact in-line system. Expertly crafted and engineered to monitor and control color, the new system provides real-time analysis of color for quality and process control.

From Konica Minolta 19 Jul 2013

New Computational Method to Predict Toxicity of Chemicals

A new computational method for working out in advance whether a chemical will be toxic will be reporting in a forthcoming issue of the International Journal of Data Mining and Bioinformatics.

19 Jul 2013

Comprehensive Report on Worldwide Markets for Industrial X-Ray Inspection Systems

Research and Markets has announced the addition of the "Industrial X-Ray Inspection Systems - Global Strategic Business Report" report to their offering.

From Research and Markets 18 Jul 2013

Element's Newtown Materials Testing Facility Increases Capabilities with New State-of-the-Art Equipment

Element Materials Technology announces a substantial investment in its materials testing facility based in Newtown, PA, with the site receiving new equipment, including a metallograph and a state-of-the-art automated dim...

From Element Materials Technology 16 Jul 2013

Editorial Highlights

Materials Testing News

SHHIC Deploys Advantest V93000 Smart Scale System for Parallel Testing of RFID Semiconductors

Chromasens Enhances allPIXA CCD Colour Line Scan Cameras

Best Ultrasonic Wave Frequencies for Detection of Adhesive Failures can be Selected

New Battery and Energy Storage Technology Testing and Commercialization Center in Rochester

NIST Develops New Standard Reference Material for Calibration of Hospital CAT Scanners

2013 R&D 100 Award Won By OlympusIX3 Inverted Microscopes

KMSA Launches Non-Contact In-Line System for Real-Time Analysis of Color

New Computational Method to Predict Toxicity of Chemicals

Comprehensive Report on Worldwide Markets for Industrial X-Ray Inspection Systems

Element's Newtown Materials Testing Facility Increases Capabilities with New State-of-the-Art Equipment

Revolutionizing Industrial Analysis with Niton Handheld XRF Technology

Exploring Catalysis and Materials Under Real-World Conditions with High-Pressure Photoelectron Spectroscopy

Unlocking Process Optimization with PGNAA

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The ETHOS UP: Microwave Labstation Built for High Performance Sample Digestion

Increase Sieving Efficiency with the SIEVEA 502 Vibratory Sieve Shaker

Thermo Scientific’s DXR3 SmartRaman+ Spectrometer for Quality Control

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Crystallography: A Discovery that Transformed Materials Science

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The Carbon Cost: Rethinking Modern Materials

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