Posted in | Materials Testing and Characterisation

Multiple Analytical tools in One for Scanning Electron Microscopy from Bruker

This year at M&M 2013 Bruker have released the X-Trace micro-spot x-ray source, and the X-Sense wavelength disperser spectrometer; two new instruments to complete their existing portfolio of tools for materials characterization in electron microscopes.

Five Analytical tools in One for Scanning Electron Microscopy from Bruker

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