Posted in | Spectrometers

The FIB Revolution - Discussing the History and Future of TEM Sample Preparation

In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or dual-beam focused ion beam microscopes (DB-FIBs), these instruments have revolutionized preparation for transmission electron microscopy, improving processes, performance, and efficiency.

This podcast examines the contribution of FIB instrumentation to material science, examining its history, implementation, the advantages of the technology, and its influence on modern life.



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