FEI’s new Magellan™ extreme high-resolution scanning electron microscope (XHR SEM) allows scientists and engineers to quickly see 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.
FEI delivers the most innovative solutions for imaging, characterization and prototyping at the nanoscale. The company’s most advanced TEM, SEM, and DualBeam™ solutions were created specifically for materials science, life science, and mining. Please visit FEI at Pittcon 2009 in booth 1642 to learn more about the Magellan and other high-resolution microscopy techniques.