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Whitehouse Scientific Release New Particle Standards for Image Analysis

Jun 30 2005

Whitehouse Scientific has introduced a new 500 to 2000 micron particle size standard designed specifically for use with image analysis systems.

While the standard appears as a smooth Gaussian distribution using sieve analysis, it actually incorporates fine structural details that can be seen only by high resolution image analysers.

The new standard has been certified using Electroformed Sieve Analysis and Image Analysis. Both techniques are traceable to the NIST and NPL international standards of length.

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