INEL, a French company specializing for 35 years in X-ray diffraction instrument design and manufacturing, joins the IUT of Caen for the 4th consecutive year to organize the 4th workshop « Combined Analysis Using X-ray and Neutron Scattering », from July 8th to 12th July 2013 in Caen, France.
This workshop will cover many aspects of "Combined Analysis" by X-Ray and neutron scattering, from fundamental requirements to technically relevant industrial and academic applications. The combined method is based on a Rietveld refinement coupled with a quantitative analysis of the texture (QTA). The MAUD software, developed by Lucas Lutterotti, uses a Rietveld adjustment method to adjust diffraction measurements from structural models. This method doesn’t only consider the texture parameters but also anisotropy, thin layer size, phases percentages…This Free software will be used during the workshop.
The objective of this workshop is to allow students, academic and non-academic researchers to obtain information relating to the characterization of structure, microstructure, phase, texture, stress and reflectivity by “Combined Analysis using X-ray and neutron scattering techniques“, and so related to a number of samples and structures including: thin films, bulk materials, materials with anisotropic crystal structures, polyphased materials, nanomaterials, multi-detectors…
Each type of analysis will be studied first individually and then integrated into the combined analysis program. Several concrete examples will be treated, from the simplest to the more complex ones using theoretical and practical sessions. "The emphasis is put on the diversity of the applications, and we encourage students and other participants to submit their problematic examples." declares Pr Daniel Chateigner of the IUT of Caen, event scientific coordinator. "Furthermore, the CRISMAT Laboratory will give access to its instruments for the practical sessions."