WITec’s RISE Microscopy Now Available with ZEISS Sigma 300 SEM

Image Credis: WITec

WITec’s solution for correlative Raman-SEM imaging is now available for ZEISS Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and ZEISS have furthered their collaboration to provide a fully-integrated instrument available as an OEM product through ZEISS that features a standard, unmodified vacuum chamber and SEM column along with a complete confocal Raman microscope and spectrometer. It expands the range of choices available to the researcher and incorporates generations of experience in Raman spectroscopic imaging and advanced structural analysis.

RISE stands for Raman Imaging and Scanning Electron microscopy. The seamless combination of the two techniques offers a distinct advantage when investigating samples, improves ease-of-use and accelerates experimental workflow. The research-grade optical microscope capability integral to every WITec microscope also helps researchers survey their sample and quickly locate areas of interest. Both the objective and sample stage required for Raman microscopy are placed within the SEM’s vacuum chamber and can therefore remain under vacuum for all measurements; the sample is simply transferred between the Raman and SEM measuring positions using the stage of ZEISS Sigma 300. The configuration allows the Raman microscope to be attached through a standard port of the SEM. The correlation of data and control of Raman measurements are carried out through WITec’s Suite FIVE software, which features a new operating concept with an intuitive interface, automated components and sophisticated software and data analysis routines.

Our Raman technology can visualize the distribution of chemical species within a sample, and do it quickly. Combine that with the structural resolution of SEM and you get a properly comprehensive understanding of a sample. It’s a powerful instrument that’s intuitive as well.

Dr. Olaf Hollricher, Co-founder and Director of R&D, WITec

ZEISS Sigma 300 provides exceptional resolution, contrast and brightness at a price point accessible to most laboratories and working groups. With its Gemini electron optics, including an Inlens secondary electron detector tailored for high-resolution surface-sensitive imaging, the instrument is inherently flexible and precise. FE-SEMs enable structural characterization of particles, surfaces and nanostructures and the ZEISS Sigma series 4-step automated workflow allows for increased productivity.

WITec’s modular Raman technology allows 3D chemical characterization by combining a high-resolution confocal microscope with a high-throughput Raman spectrometer. Raman imaging, pioneered by WITec, is a label-free and non-destructive technique capable of identifying and imaging the molecular composition of a sample, making it an ideal complement to scanning electron microscopy.

“Comprehensive characterization is essential throughout many scientific fields such as battery research, geology and life sciences. The integration of RISE microscopy in our correlative portfolio aims at delivering cutting edge technology to these and many other areas of research. We are very happy that with WITec we have a partner that shares our ambition to drive scientific advancement,” says Dr. Michael Rauscher, Head of Business Sector Materials Sciences at ZEISS Microscopy.

RISE really fulfills the promise of correlative microscopy. It gives the user the strengths of Raman and SEM without compromise, all consolidated in one easy to use instrument.

Dr. Philippe Ayasse, Project Manager, RISE microscopy, WITec

All the functions of the respective stand-alone SEM and Raman systems are preserved when combined. Switching between measurement modes is accomplished quickly and easily through the software, which also facilitates the transformation of Raman spectroscopic data into an image which can then be overlaid onto the SEM image to produce a RISE image. This correlative approach can greatly benefit researchers in nanotechnology, life sciences, geosciences, pharmaceutics, materials research and many other fields of application.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    WITec GmbH. (2017, August 07). WITec’s RISE Microscopy Now Available with ZEISS Sigma 300 SEM. AZoM. Retrieved on August 13, 2020 from https://www.azom.com/news.aspx?newsID=48044.

  • MLA

    WITec GmbH. " WITec’s RISE Microscopy Now Available with ZEISS Sigma 300 SEM". AZoM. 13 August 2020. <https://www.azom.com/news.aspx?newsID=48044>.

  • Chicago

    WITec GmbH. " WITec’s RISE Microscopy Now Available with ZEISS Sigma 300 SEM". AZoM. https://www.azom.com/news.aspx?newsID=48044. (accessed August 13, 2020).

  • Harvard

    WITec GmbH. 2017. WITec’s RISE Microscopy Now Available with ZEISS Sigma 300 SEM. AZoM, viewed 13 August 2020, https://www.azom.com/news.aspx?newsID=48044.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit