Jan 22 2007
Oxford Instruments has launched a new fast, lightweight, hand-held XRF analyzer - the X MET3000TX+. With one pull of the trigger, the X MET3000TX+ delivers faster than ever color-coded alloy identification and assay analysis.
The X MET3000TX+ is configured for producing fast and accurate analysis of metals for the recycling industry and for reliable Positive Material Identification (PMI) in the metal fabrication and process industries.
The new PentaPINTM detector - based on the Oxford Instruments’ proven and patented PentaFET® technology means faster analysis and lower detection limits for all elements. Low detection limits are an irreplaceable feature when low concentrations of valuable metals and important alloying elements of metals need to be measured.
The user friendly software is configured for analyzing and identifying different metal alloys according to the requirements of different applications. Results can be color coded for very easy interpretation of the alloy grade or the presence of harmful tramp elements. The X MET3000TX+ now supports multiple languages including Chinese, Russian, German, French and others. Contact Oxford Instruments to determine if your language is supported.
The X MET3000TX+ is the third generation of tube based handheld XRF instruments developed by Oxford Instruments in a continuing effort to provide measurement tools which meet our customers needs and expectations.
Responding to customer concerns for radiation safety, Oxford Instruments is also introducing a new optional bench-top stand with a large enclosed chamber with safety interlock. This allows the X MET3000TX+ to be used in a closed beam configuration for substantially improved radiation safety during the measurement of small samples.