Quantachrome to Promote Catalyst Characterization Equipment at Catalyst Meeting

Quantachrome Instruments will be exhibiting their top-of-the-line catalyst characterization equipment at the 2007 Meeting of the North American Catalysis Society, or "NAM" as it has come to be known.

Quantachrome specializes in catalyst characterization equipment for metal area, dispersion, TPR/TPO/TPD, BET surface area, pore size, density, moisture sorption. Technologies include static/volumetric measurements, flow/pulse methods with TCD and/or mass-spec, mercury intrusion, and gas pycnometry. The remarkable AS-1C-TCD hybrid static/flow system for volumetric chemi/physi isotherms PLUS temperature programmed flow-based methods will take center stage on booth number 114.

Matthias Thommes, Quantachrome's Director of Applied Technology, will be presenting the following poster at the meeting: "Advanced Textural Characterization of Novel Nanoporous Materials with Hierarchical Pore Structure", co-authored with O. Sel and and B.Smarsly (both Max-Planck Institute of Colloids and Interfaces, Golm Germany), P. Ravikovitch (TRI Princeton, USA) and A. Neimark (Rutgers University, USA).

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