Advanced X-Ray Reflectometry Tools for Thin Film Analysis from PANalytical

PANalytical’s X’Pert Reflectivity 1.2 is a new version of the company’s powerful software tool for the analysis of X-ray reflectometry data, important in thin film production and thin film processing research. X’Pert Reflectivity enables the automatic fitting of simulated to experimental specular X-ray reflectivity curves. This new version, which can be launched and controlled using X’Pert APP (Automatic Processing Program), increases the level of automation possible. Using a choice of three automatic fitting procedures, the software performs multiple simulations to refine selected sample and instrument parameters, ensuring the best fit with the measured data.

Traditionally, such high-level analysis has been the preserve of experts, but the X’Pert Reflectivity package makes advanced reflectometry techniques available even to the inexperienced user. Part of PANalytical’s X’Pert software range which uses XRDML formatting, X’Pert Reflectivity is designed for use with the company’s X’Pert PRO MRD X-ray diffractometers.

With the emphasis on ease of use, X’Pert Reflectivity 1.2 operates through an intuitive Windows-based user interface. An extensive materials database for use in simulation and fitting is built into the package. This includes information such as elemental atomic numbers and masses, mass absorption and anomalous dispersion coefficients for different X-ray wavelengths. The database is extendible and new materials and values for other wavelengths may be added.

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