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Dynamic Light Scattering Particle Characterization Systems from Microtrac

Jay Schild from Microtrac shows us their range of dynamic light scattering particle characterization systems. This includes the Nanotrac which features an external probe for carrying out in situ particle size distribution measurements and the Zetatrac, which is able to determine both particle size distribution and zeta potential measurements seamlessly. Both instruments can measure particles in the range 1nm to 6 microns.

Run time - 2:11 min

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