Videos | Pittcon 2012 Interviews

Pittcon 2012 Interviews Videos

Pittcon 2012 Interviews Videos

Tim Drake - Aspex Corp - ASPEX EXpress Desktop - Pittcon 2012

Tim Drake from Aspex Corp at Pittcon 2012.

Introducing the ASPEX EXpress Desktop SEM: When size and budgets are key, the ASPEX EXpress desktop SEM provides superior particle analysis capabilities at an affordable price. Designed for "out of the lab" applications, the ASPEX EXpress desktop has plenty of power to do routine automated particle analysis with ease, speed and reliability.

The proX Desktop SEM with EDS from Phenom-World

Bill Flecky from Phenom-World shows us their new flagship, desktop scanning electron microscope (SEM) the proX, which includes elemental analysis using an in-built EDS system.

The ICAP-Q ICPMS from Thermo Scientific

The ICAP-Q ICPMS from Thermo Scientific is a new instrument that has been designed from the ground up that not only provides ease of use, but also easy maintenance. While the software interface makes the instrument easy to drive other features such as the redesigned Q-Cell collision cell help increase productivity by a factor of 2 over other ICPMS systems as well as improving sensitivity by 3 to 4 times.

Trace 1300 Series Gas Chromatographs from Thermo Scientific

Thermo Scientific have introduced the Trace 1300 Series gas chromatographs that incorporate breakthrough technology. Fausto Pigozzo shows us the new features including new injectors and detectors which help increase productivity and sensitivity with fast data acquisition in a more compact instrument.

Thermogravimetric Analyzer TG 209 F1 Libra (TGA) from Netzsch Instruments

The TG 209 F1 Libra is the latest generation TGA (thermogravimetric analyzer) from Netzsch Instruments. It measures mass change as a function of temperature and has an operatingtemperature of between 10 and 1100°C.

The Beckman Coulter Mutisizer 4 Particle Size Analyzer

The Multisizer 4 is a particle size analyzer from Beckman Coulter that uses the Coulter principle to determine particle size.

Hellma High Precision Cuvettes

Dr Jochen Hallmann from Hellma demonstrates their High Precision Cuvettes. Hellma are a glass and quartz glass manufacturer with 90 years experience. Here Dr Hallmann demonstrates the wide range of properties that their cuvettes have. He also demonstrates their sealed calibration standards cuvettes that can be used to validate photometers.

Dynamic Mechanical Analyzer 3D DMA from Psylotech

The 3D DMA, dynamic mechanical analyzer from Psylotech is used to test polymeric materials to produce data for use in numerical simulations such as FEA (finite element analysis).

The Impact of the EU's Definition of Nanomaterials

The EU will soon feel the impact of the recently published their definition of nanomaterials. Jeremy Warren from Nanosight indicates how this will impact EU, in particular areas such as ecotoxicology and environmental monitoring.

Demonstration of the XploRA Raman System from HORIBA

Vincent Larat from HORIBA explains how the XploRA Raman spectrometer works and provides us with a real time demonstration of how the system works.

Application of Optical Profiler from KLA at Pittcon 2012

This video shows the application of optical profiler from Zeta Instruments. A transparent sample is located on the stage of the profiler.

The SpectroVISC Q3000 Kinematic Viscometer from Spectro Inc

Dan Walsh from Spectro Inc shows us the main features and demonstrates just how fast and easy the Spectro VISC Q3000 portable kinematic viscometer is to use. It is extremely small and can be easily taken on-site to provide on the spot viscosity readings, producing results in a matter of seconds.

The Malvern Mastersizer 3000 Particle Size Analyzer

The Mastersizer 3000 from Malvern Panalytical replaces the Mastersizer 2000 particle size analyzer. Julie Chen gives us a run down on the new features and operation of the Mastersizer 3000.

Malvern Panalytical's OBLF OES (Optical Emission Spectrometer) for Metals Analysis

Tim Glose from Panalytical shows us their OBLF OES (optical emission spectroscopy system) for analysis of metals including trace element analysis. The system uses new technology that enables the instrument to take 2 measurements simultaneoulsy, with results being produced in around 15 seconds.

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