MRS 2011 Fall Meeting Videos

MRS 2011 Fall Meeting Videos
The i-Raman system from B&W Tek has received a number of upgrades recently. Travis Thompson takes a few minutes to outline these upgrades and their benefits to the use.
Bill Henderson from Leica shows us the DCM 3D surface metrology tool. The system features a confocal microscope and interferometer and features LED illumination and CCD detector.
Sam Halim, CEO of Nanograde gives us a quick run down on their extremely versatile system for producing customized nanoparticles and dispersion. As you will see from the demonstration, Nanograde can produce a vast array of materials made to client specifications.
Brian Crawford from KLA Tencor demonstrates their P-6 profilometer that uses contact stylus technology that typically uses a 2µm stylus tip although other options are abvailable.
The Bruker ContourGT-X8 is their top of the line optical profiler. It uses technology that has been developed and refined to create 3-dimensional maps of sample surfaces.
Park Systems launched the NX10 atomic force microscope (AFM) recently and showed it for the first time at the MRS Fall Meeting in Boston. Mark Cyffka takes us for a tour of their all new AFM which is claimed to be the world's most accurate AFM.
David Lewis form Nanonics Imaging shows us their Multiview 4000 multiprobe SPM system. It can cater for up to 4 independent probes creating a true nano workstation. The open platform design enables integration with optical or scanning electron microscopes as well as Raman microscopes.
Stanislav Leesment from NT-MDT shows us their new SOLVER Nano AFM (atomic force microscope) that was launched t his years MRS Fall Meeting on Boston. Despite its diminutive size it includes all the functions of much larger AFMs.
Roshan Shetty from Anasys Instruments shows us their new AFM+ platform. This new development has been designed as a modular entry level instrument that combines an atomic force microscope and thermal analysis capabilities. It has been designed so that it can be upgraded to their NanoIR spec at a later date.
Leica's Todd Perez shows us their TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.
Are you interested in performing calorimetry experiments quickly? If so you should take a look at the Mettler Toledo Flash DSC 1 calorimeter. This unit bridges the gap between research and production, allowing the user to more accurately run simulations that are indicative of real life processing conditions.
The IH15a from Across International is a laboratory sized induction heater suited to melting, welding and surface heating of materials. It features a very compact size and digital controller that can control heating rate, soak time and cooling rate. It can be supplied with crucibles such as graphite or silica crucibles in alumina jackets.
Dr. Olaf Hollricher from Witec shows us their award winning TrueSurface Microscopy system. It uses Raman spectroscopy technology but has advantages over confocal Raman spectroscopy in that it is able to accurately track the surface of the sample and in the process keeping it in focus at all times.
The 8400 Series Hall Effect Measurement System (HEMS) is Lake Shore Cryotronics latest addition to their range of HEMS that are used to characterize the electronic properties of semiconductors. In particular they are used to determine carrier type, density and mobility as well as their hall co-efficient.
The Evactron plasma decontamination systems from XEI Scientific ared used to clean samples or chambers. They removing organic contaminants and hydrocarbon residues from samples or or on instruments such as scanning electron microscopes (SEM), transmission electron microscopes (TEM) or focused ion beam systems (FIB).
We spoke to Stefan Kaemmer at the 2011 MRS Fall Meeting in Boston and he gave us a run down on their new Innova-IRIS system which combines the Bruker Innova AFM with the Renishaw raman confocal microscope. The system allows you to correlate chemical and topographical information at the same time.
Bruker's CETR-Apex system is a nanomechanical testing system that features easily interchangeable heads allowing it to be able to used as a nano or micro indentation system as well as micro and nano scratch. Denis Koosau from Bruker shows us how easy it is to change a test head in this short video.
The Nexdep electron beam evaporation system from Angstrom Engineering has been designed for research and development applications. It can operate in either electron beam evaporation, resistive evaporation or sputter deposition modes.
Denise Hoban from Micro Materials tells us about their recently launched NanoTest Vantage nanomechanical testing system. It is a unique instrument that can carry out a number of tests at temperatures ranging from less than 0°C up to 750°C.
The MicroXam100 from KLA Tencor is a surface profilometer and white light optical interferometer. Jim Zobel explains how the system works and demsinatres it's fast data acquisition rates.
The Dimension Fastscan from Bruker is the fastest AFM on the market. John Thornton takes us for a tour of this instrument pointing out key features and runs a demonstration to illustrate how fast data can be collected. The speed of this instrument make it suited to rapid sampling across large samples and production environments where speed is critical.