Pittcon 2009 Interviews Videos

Pittcon 2009 Interviews Videos
David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.
Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system
The Genesis ICP system from Spectro is a low cost, high throughput instrument that makes an ideal alternative to more expensive atomic absorption spectrometers. It is typically used in the oil, soil, environmental and metallurgical fields.
Dave Dolak from Malvern Instrument showcases their new Malvern Zetasizer µV and Zetasizer APS, which are making the debut at Pittcon 2009. These instruments are dedicated batch dynamic light scattering instruments which feature the ultimate in sensitivity and use the lowerst sample volumes, as low as 2 microlitres.
This video provides a demonstration of the Skyray EDX Pocket III handheld XRF spectrometer. In this example, they test a cell phone casing to see if it complies with RoHS, hazardous materials requirements.
Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.
Chris Farine from Ceramaret shows us some examples of some of the advanced ceramic components that they manufacture.
Janie Dubois from Malvern Instruments takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.
The DT1200 from Horiba Particle Products is an acoustic spectrometer. It is a complete tool that can determine both particle size distribution and zeta potential. Mark Bumiller explains how these technologies work.
Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.
Fred Mazzeo introduces us to the Kinexus Rheometer from Malvern Instruments which is suited to applications such as paints, coatings and polymers. The Kinexus takes rheometry to the next level.
Alexander Seyfarth from Bruker AXS introduces us to the S8 Lion, a new XRF unit designed specifically for the cement industry. This is the latest in the S8 series and features multi-channel analysis, which provides much faster analysis compared to sequential analysis instruments.
Mark Bumiller from Horiba Particle Products gives us a brief explanation of how laser diffraction particle sizing works while giving us a tour of the Partica LA-950, a laser diffraction particle size analyzer suited to industries such as pharmaceuticals, chemicals, cement, food etc
Ray Matejczyk from Bruker AXS shows us the key features of the D2 Phaser compact benchtop x-ray diffraction (XRD) system. The D2 Phaser was introduced at Pittcon 2009.
PANalytical's Brian Litteer takes us for a tour of their brand new XPert Pro MPD (multi purpose diffractometer) or x-ray diffraction (XRD) system that is suited to industrial and academic materials analysis applications.
Mike Gilley from Micromeritics shows us the Gemini VII tat is being shown at Pittcon 2009 for the first time. The Gemini VII is a surface area and porosity measurement instrument.
Scott Bergeron from Buck Scientific shows us the key features of the prototype 530 Infrared spectrophotometer, which is based on the M500 model of which it shares several characteristics. It is a dispersive spectrophotometer that is ideally suited to analysis of organic materials such as polymers and provides information on functional groups.
WITec's Jo Koenen shows us through the various features and cpabilities of the alpha300 Raman/AFM/SNOM. The alpha300 features scanning probe as well as high resolution optical and Raman microscopes techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.
Chris Rogowski from McDanel Advanced Ceramic Technology demonstrates their manufacturing capabilities. They specialize in tubular ceramic products ranging in size from just millimeters in diameter to over 300 mm, with single or multi-bore configurations manufactured using extrusion and slip casting.
Buck Scientific's Scott Bergeron points out the key features of the 210 Atomic Absorption Spectrophotometer such as: the 3 lamp turret; deuterium background correction; and swappable air/acetylene and nitrous/acetylene flames.
Aspex Corp's Tim Drake takes a few minutes to point out the the key features of their Personal Scanning Electron Microscope, PSEM eXplorer, which is an integrated SEM/EDX system designed for rapid automated particle analysis. Some of the main features include large sample chamber and silicon drift detector.
Scott Bergeron from Buck Scientific takes a few minutes to point out the key features of their Accusys 211 Atomic Absorption Spectrophotometer with graphite furnace option. The graphite furnace option can be added to any of their 210 and 211 series AAS instruments.
Dave Sampson from Bruker AXS shows us through their new N8 NEOS atomic force microscope. The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up.
Peter Bouza from Micromeritics demonstrates the Particle Insight particle shape analyzer. It is a dynamic instrument that uses flow through image analysis.
Joe Wolfgang from Malvern Instruments points out the key features of the Mastersizer 2000 laser diffraction particle size analyzer which determines particle size distributions for particles in the range from 20nm to 2mm. The Mastersizer 2000 can cope with dry or wet samples.
Ron Lutz from the Cannon Instrument Company introduces us to the PolyVISC system which is used by polymer and petrochemical companies in research and development and quality control applications.
Hiden Analytical's Mark Buckley explains the operation and capabilities of the Hiden EQP mass spectrometer which is used for plasma characterisation. It is typically used by process development engineers and research technicians to optimise plasma conditions for the manufacture and fabrication of new and novel devices.
Bob Burton gives us a demonstration of how easy to use the Spectro Midex Micro X-Ray Fluorescence (XRF) spectrometer is to use.
Jason Sanchez from Malvern Instruments tells us about the Viscotek Size exclusion gas chromatography system which is suited to all types of polymers, proteins, biopolymers etc.
Mark Buckley from Hiden Analytical shows us through the gas sampling HPR20 Quadrupole Mass Spectrometer which is ideal for analysing gases from process lines.
Mark Bumiller from Horiba Particle Products introduces us to some particle characterization by static and dynamic image analysis and the Horiba PSA300 and Camsizer. These instruments calculate particle size and shape distributions.
Jeff McGinn from McCrone introduces us to two new tools for microscopy from Linkam, the T95 Temperature Programmer on sow for the first time at Pittcon 2009 and the 420 thermal stage.
Chris Vander Tuuk then shows us through Olympus’ latest instrument, the LEXT laser confocal microscope. The LEXT features a 5 objective turret with objectives from 120 to 14400 times magnification. The standard stage has a travel of 150x150mm, but can be adapted to cater for 300mm wafers.
In an exclusive interview carried out at Pittcon 2009, we speak with Barbara Foster from the Microscopy and Imaging Place or The MIP about the first ever global report on the AFM market place using feedback from AFM users themselves.
The eXPRESS Line furnaces from Thermcraft as so-named due to their short 2 week lead time to be manufactured. Jim Miller points out the key features and options of the box furnace range.
David Larson from Brookfield Engineering demonstrates the simple operation of the DVII+n Pro Viscometer, which is the latest version of their most popular instrument.
The eXPRESS Line furnaces from Thermcraft as so-named due to their short 2 week lead time to be manufactured. Jim Miller points out the key features and options of the split tube furnace range.
Mike Fogarty from Rheotek introduces us to their JETVISC kinematic viscometer which has been designed for testing aviation fuels, diesel fuels, hydraulic fluids, transformer oils and other similar materials.
Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments. He shows us 3 instruments that vary in chamber size, with the largest able to take samples 30cm in diameter and offering vacuum analysis and a motorized stage for line scans and area analysis.
Ulf Nobbmann from Malvern Instruments shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.
Chris Vander Tuuk from Olympus Scientific Equipment shows us the BX51, which is their flagship materials research microscope.