Pittcon 2009 Interviews Videos

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AXAA 2011 Conference
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Biomaterials
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Carbon Fibre - Future Directions Interviews
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Ceramic Materials
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Coatings
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Composite Materials
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Corrosion
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EMC 2012 - Manchester, UK
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Ferrous Alloys
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Functional Materials
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Gas Chromatography
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Graphene
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Hard Materials
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High Temperature Materials
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ICONN 2010 Interviews
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Light Alloys
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M&M 2012 - Phoenix, Arizona, USA
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Machining
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Materials and Austceram 2009
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Materials Processing
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Materials Science and Technology 2008 (MS+T'08)

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Materials Science and Technology 2009 (MS+T'09)
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Materials Testing and Characterisation
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Metal Casting / Foundry
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MRS 2008 Fall Meeting Video Interviews
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MRS 2010 Fall Meeting
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MRS 2011 Fall Meeting
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MRS 2012 Fall Meeting Video Interviews
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Nanomaterials
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Non-Ferrous Alloys
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Pittcon 2009 Interviews
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Pittcon 2011 Interviews
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Pittcon 2012 Interviews
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Pittcon 2013
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Precious Metals
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Recylced and Sustainable Materials
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Rubbers and Elastomers
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Stainless Steel
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Structural Materials
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Thermoplastics
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Thermosetting Polymers
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Welding and Brazing

Pittcon 2009 Interviews Videos

The Partica LA-950 Laser Diffraction Particle Size Analyzer from Horiba

Mark Bumiller from Horiba Particle Products gives us a brief explanation of how laser diffraction particle sizing works while giving us a tour of the Partica LA-950, a laser diffraction particle size analyzer suited to industries such as pharmaceuticals, chemicals, cement, food etc

The HPR20 Quadrupole Mass Spectrometer from Hiden Analytical

Mark Buckley from Hiden Analytical shows us through the gas sampling HPR20 Quadrupole Mass Spectrometer which is ideal for analysing gases from process lines.

The N8 Neos Atomic Force Microscope from Bruker XRD

Dave Sampson from Bruker AXS shows us through their new N8 NEOS atomic force microscope. The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up.

Particle Characterization by Static and Dynamic Image Analysis by Horiba

Mark Bumiller from Horiba Particle Products introduces us to some particle characterization by static and dynamic image analysis and the Horiba PSA300 and Camsizer. These instruments calculate particle size and shape distributions.

The Nanosight LM20 Nanoparticle Analysis System

Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system

The Spectro Genesis ICP Spectrometer - Operation and Key Features

The Genesis ICP system from Spectro is a low cost, high throughput instrument that makes an ideal alternative to more expensive atomic absorption spectrometers. It is typically used in the oil, soil, environmental and metallurgical fields.

The Malvern Mastersizer 2000 - Particle Size Analyzer

Joe Wolfgang from Malvern Instruments points out the key features of the Mastersizer 2000 laser diffraction particle size analyzer which determines particle size distributions for particles in the range from 20nm to 2mm. The Mastersizer 2000 can cope with dry or wet samples.

The Linkam T95 Temperature Controller and 420 Thermal Stage for Microscopy

Jeff McGinn from McCrone introduces us to two new tools for microscopy from Linkam, the T95 Temperature Programmer on sow for the first time at Pittcon 2009 and the 420 thermal stage.

The BX51 Materials Research Microscope from Olympus

Chris Vander Tuuk from Olympus Scientific Equipment shows us the BX51, which is their flagship materials research microscope.

The 210 Atomic Absorption Spectrophotometer from Buck Scientific

Buck Scientific's Scott Bergeron points out the key features of the 210 Atomic Absorption Spectrophotometer such as: the 3 lamp turret; deuterium background correction; and swappable air/acetylene and nitrous/acetylene flames.

The Zetasizer Particle Sizing Range of Instruments from Malvern

Dave Dolak from Malvern Instrument showcases their new Malvern Zetasizer µV and Zetasizer APS, which are making the debut at Pittcon 2009. These instruments are dedicated batch dynamic light scattering instruments which feature the ultimate in sensitivity and use the lowerst sample volumes, as low as 2 microlitres.

The JETVISC Kinematic Viscometer from Rheotek

Mike Fogarty from Rheotek introduces us to their JETVISC kinematic viscometer which has been designed for testing aviation fuels, diesel fuels, hydraulic fluids, transformer oils and other similar materials.

The EDX Pocket III Handheld XRF Spectrometer from Skyray

This video provides a demonstration of the Skyray EDX Pocket III handheld XRF spectrometer. In this example, they test a cell phone casing to see if it complies with RoHS, hazardous materials requirements.

The Viscotek GPC/SEC System from Malvern Instruments - Features and Capabilities

Jason Sanchez from Malvern Instruments tells us about the Viscotek Size exclusion gas chromatography system which is suited to all types of polymers, proteins, biopolymers etc.

The JEOL NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM)

Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.

The Particle Insight Particle Shape Analyzer from Micromeritics

Peter Bouza from Micromeritics demonstrates the Particle Insight particle shape analyzer. It is a dynamic instrument that uses flow through image analysis.

The AXIOS X-Ray Fluorescence (XRF) Spectrometer from PANalytical

David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.

The DT1200 Acoustic Spectrometer for Particle Characterization from Horiba

The DT1200 from Horiba Particle Products is an acoustic spectrometer. It is a complete tool that can determine both particle size distribution and zeta potential. Mark Bumiller explains how these technologies work.

The Cilas 1190 Laser Particle Particle Size Analyzer - Features and Operation

John Kuehl from Cilas shows the new 1190 laser particle size analyzer. The system is unique in that it can cope with both wet and dry samples. It also incorporates an image analysis system that allows the user to determine particle shape details.

Advanced Ceramic Materials and Components Supplied by Ceramaret

Chris Farine from Ceramaret shows us some examples of some of the advanced ceramic components that they manufacture.

The Hiden EQP Mass Spectrometer for Plasma Characterisation

Hiden Analytical's Mark Buckley explains the operation and capabilities of the Hiden EQP mass spectrometer which is used for plasma characterisation. It is typically used by process development engineers and research technicians to optimise plasma conditions for the manufacture and fabrication of new and novel devices.

The Gemini VII Surface Area and Porosity Measurement Tool from Micromeritics

Mike Gilley from Micromeritics shows us the Gemini VII tat is being shown at Pittcon 2009 for the first time. The Gemini VII is a surface area and porosity measurement instrument.

The Spectro Midex Micro XRF Spectrometer - Demonstration

Bob Burton gives us a demonstration of how easy to use the Spectro Midex Micro X-Ray Fluorescence (XRF) spectrometer is to use.

The 530 Infrared Spectrophotometer from Buck Scientific

Scott Bergeron from Buck Scientific shows us the key features of the prototype 530 Infrared spectrophotometer, which is based on the M500 model of which it shares several characteristics. It is a dispersive spectrophotometer that is ideally suited to analysis of organic materials such as polymers and provides information on functional groups.

The DVII+ Pro Viscometer from Brookfield Engineering

David Larson from Brookfield Engineering demonstrates the simple operation of the DVII+n Pro Viscometer, which is the latest version of their most popular instrument.

AFM Users Contribute to Unique Market Study

In an exclusive interview carried out at Pittcon 2009, we speak with Barbara Foster from the Microscopy and Imaging Place or The MIP about the first ever global report on the AFM market place using feedback from AFM users themselves.

The Zetasizer Nano Particle Characterization System from Malvern Instruments

Ulf Nobbmann from Malvern Instruments shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.

The Bruker XRD S8 Lion XRF Spectrometer for the Cement Industry

Alexander Seyfarth from Bruker AXS introduces us to the S8 Lion, a new XRF unit designed specifically for the cement industry. This is the latest in the S8 series and features multi-channel analysis, which provides much faster analysis compared to sequential analysis instruments.

The eXplorer Personal Scanning Electron Microscope (PSEM) from Aspex Corp

Aspex Corp's Tim Drake takes a few minutes to point out the the key features of their Personal Scanning Electron Microscope, PSEM eXplorer, which is an integrated SEM/EDX system designed for rapid automated particle analysis. Some of the main features include large sample chamber and silicon drift detector.

The PANalytical XPert Pro Multi Purpose X-Ray Diffraction System (XRD)

PANalytical's Brian Litteer takes us for a tour of their brand new XPert Pro MPD (multi purpose diffractometer) or x-ray diffraction (XRD) system that is suited to industrial and academic materials analysis applications.

The Olympus LEXT Laser Confocal Microscope

Chris Vander Tuuk then shows us through Olympus’ latest instrument, the LEXT laser confocal microscope. The LEXT features a 5 objective turret with objectives from 120 to 14400 times magnification. The standard stage has a travel of 150x150mm, but can be adapted to cater for 300mm wafers.

Tubular Ceramic Products from McDanel Advanced Ceramic Technology

Chris Rogowski from McDanel Advanced Ceramic Technology demonstrates their manufacturing capabilities. They specialize in tubular ceramic products ranging in size from just millimeters in diameter to over 300 mm, with single or multi-bore configurations manufactured using extrusion and slip casting.

The alpha300 Raman/AFM/SNOM from WITec

WITec's Jo Koenen shows us through the various features and cpabilities of the alpha300 Raman/AFM/SNOM. The alpha300 features scanning probe as well as high resolution optical and Raman microscopes techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.

Thermcraft eXPRESS Line Split Tube Furnaces - Key Features

The eXPRESS Line furnaces from Thermcraft as so-named due to their short 2 week lead time to be manufactured. Jim Miller points out the key features and options of the split tube furnace range.

The PolyVISC Automated Polymer Viscosity Testing System from Cannon Instruments

Ron Lutz from the Cannon Instrument Company introduces us to the PolyVISC system which is used by polymer and petrochemical companies in research and development and quality control applications.

The Malvern Kinexus Rheometer - Key Features, Capabilities and Operation

Fred Mazzeo introduces us to the Kinexus Rheometer from Malvern Instruments which is suited to applications such as paints, coatings and polymers. The Kinexus takes rheometry to the next level.

The Morphologi G3 Particle Characterization System - Features and Demonstration

Janie Dubois from Malvern Instruments takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.

Micro XRF (X-Ray Fluorescence) Product Range from Bruker XRD

Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments. He shows us 3 instruments that vary in chamber size, with the largest able to take samples 30cm in diameter and offering vacuum analysis and a motorized stage for line scans and area analysis.

The 211 Atomic Absorption Spectrophotometer with Graphite Furnace from Buck Scientific

Scott Bergeron from Buck Scientific takes a few minutes to point out the key features of their Accusys 211 Atomic Absorption Spectrophotometer with graphite furnace option. The graphite furnace option can be added to any of their 210 and 211 series AAS instruments.

The D2 Phaser Benchtop XRD from Bruker XRD

Ray Matejczyk from Bruker AXS shows us the key features of the D2 Phaser compact benchtop x-ray diffraction (XRD) system. The D2 Phaser was introduced at Pittcon 2009.

The eXpress Personal Scanning Electron Microscope from Aspex Corp

Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.

Thermcraft eXPRESS Line Box Furnaces - Key Features

The eXPRESS Line furnaces from Thermcraft as so-named due to their short 2 week lead time to be manufactured. Jim Miller points out the key features and options of the box furnace range.

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