Videos | MRS 2010 Fall Meeting

MRS 2010 Fall Meeting Videos

MRS 2010 Fall Meeting Videos

Combined AFM and Raman with the Multiview System from Nanonics

The Multiview Series from Nanonics Imaging Ltd combines AFM and Raman. The Nanonics can be supplied as an upgrade to an existing Raman system or as a complete system. David Lewis from Nanonics explains how their system works and its advantages and the benefits of being able to determine the chemical structure of the material as well as its topography.

The Flashline Series of Thermal Property Analyzers from Anter Corp

Tony Torsell from Anter Corporation shows us their Flashline Series of thermal property analyzers. These intruments can measure properties such as thermal diffusivity, specific heat capacity and thermal conductivity using laser flash or xenon flash techniques.

The MMC 274 Nexus Multi Module Calorimeter from Netzsch Instruments

Dave Shepard from Netzsch Instruments MMC 274 Nexus Multi Module Calorimeter. It is suited to liquids and battery materials. The instrument can employ different modules depending on what type of measurement is required. Modules that can be supplied can perform measurement akin to differential scanning calorimetry (DSC), accelerating rate calorimetry and very fast tracking, to simulate runaway heating.

The Zeta-20 Optical Profilometer from Zeta Instruments

Ben Garland from Zeta Instruments demonstrates their Zeta-20 Optical Profilometer which can measure surface and textural properties of materials such as solar cells, microfluidics, biologicals etc. It does this by taking image slices and creating a composite 3-D image featuring real color. Their software package allows easy analysis of surface features and the ability to produce statistical analyses.

The alpha 300R Plus Confocal Raman Microscope from WITec

The alpha 300R Plus from WITec is a confocal Raman microscope with two scanning systems, a coarse motorized stage for large areas and a piezo stage for fine, sub nanometer adjustments. It is capable of producing 3 dimensional optical and chemical information and features optical components that are all coupled by optical fibres. It is also able to have an AFM added to increase its resolution to the sub-nanometer level.

The Niton Handheld XRF Analyzer Range from Thermo Fisher Scientific

The range of Niton Handheld XRF analyzer products from Thermo Fisher Scientific is displayed. These products include the Niton XL2 and the flagship Niton XL3t. Features and applications of both instruments are described. Accessories for making measurements easier and faster in the field are also shown.

The ContourGT Series of Optical Profilers Featuring AcuityXR Measement Technology

Ross Smith from Bruker tells us about the all new AcuityXR measurement mode for optical and surface profilers. Introduced at 2010 MRS Fall Meeting, AcuityXR combines hardware and software to provide resolution beyond the diffraction limit. This allows the optical profiler to image features down to 130nm. Acuity XR is available on Bruker's range of Contour GT optical and surface profilers.

The LVEM5 Benchtop TEM from Delong America

The LVEM5 from Delong America is a unique piece of equipment, being the only benchtop TEM on the market. It is also interesting in that it can operate as a benchtop FE-SEM, and STM and an optical microscope as well. The user can easily switch between modes using the software.

Cryogenic Probe Stations from Lake Shore Cryotronics - Features and Applications

Brad Dodrill from Lake Shore Cryotronics shows us through one of their cryogenic micromanipulator probe stations. These are used to characterize electronic and magneto transport properties of materials such as semiconductor wafers.

The New D8 Discover X-Ray Diffractometer (XRD) from Bruker XRD

Peter LaPuma from Bruker AXS takes us for a tour of the new flag ship D8 Discover X-Ray Diffractometer (XRD). One of the key features to this XRD is the easy exchange optics that can be swapped in just seconds and any change is both auto-detected by the system and is self aligning, requiring no special tools to do so. This allows rapid swapping of configurations.

The NHT2 Nanoindentation Tester/AFM from CSM Instruments

The NHT2 Nanoindentation tester from CSM Instruments combines a nanoindenter and AFM in one compact, affordable, easy to use desktop unit. This version has been re-designed and now features liquid compatibility, a wider load range and multi sample capability. The use of two video cameras, proving a side view and a top view of the sample eliminate the need for an optical microscope.

The Easy to Use SmartSPM from AIST-NT

Bill Flecky and Andrey Krayev from AIST-NT show us how easy the SmartSPM is to use. It is able to perform scans very quickly, and in the space of just a few minutes we see them set up the instrument and take a series of measurements.

The FlexAFM and Its Accessories from Nanosurf

The FlexAFM from Nanosurf is a full featured atomic force microscope designed for research applications. It features a modular design, flexure stage which minimizes background movement, decoupled z-piezo and a unique interchangeable nose cone permitting use in air or liquid media, making it suitable for biological samples.

Source Measurement Units for Electrical Properties Characterization from Agilent Technologies

Celeste Jenkins from Agilent Technologies explains the importance of source measurement units or SMU's for the characterization of electrical properties of materials and devices. They are typically used on materials like silicon-based solar cells.

AIST-NT Show Off Their OmegaScope Combines AFM-Raman System

Take a quick video tour of the OmegaScope AFM-Raman from AIST-NT. The OmegaScope is based on AIST-NT's Smart-SPM, and features either single or 3 laser Raman capabilities and an objective lens up to 100x magnification.

The New Nanotribometer from CSM Instruments

Nicholas Randall features and capabilities new Nanotribometer CSM Instruments. It uses similar loadings to an AFM, but can use wear partners with different size and shapes comapred to an AFM probe tip.

The VHX-1000 Fully Integrated Digital Microscope from Keyence

Sean Gasparovic shows us the Keyence VHX-1000 fully integrated digital microscope system. It includes an optical system designed specifically to work with a CCD, with magnification from 0.1X to 5000X

Roughness and Texture Analysis Software from Digital Surf

Mountains Map 6 is the latest generation roughness and texture analysis software from Digital Surf. It is designed to work with instruments such as optical profilometers, confocal microscopes, scanning probe and atomic force microscopes and can deal with samples as large as automotive panels down to AFM size of just a few microns. The latest features of version 6.0 are outlined and a live demonstration of its capabilities provided.

Characterizing Battery and Storage Materials Using Electrochemical Strain Microscopy

Asylum Research has introduced unique technology for characterizing battery materials for their Cypher AFM. Called Electrochemical Strain Microscopy, this technique allows you to look at lithium ion transport capabilities of materials. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique works and Roger Proksch from Asylum Research demonstrates how the Cypher produces data and its relevance to the field of battery materials.

Using the Niton XL3t Handheld XRF Analyzer in the Mining Industry

Jon Shein from Thermo Fisher Scientific provides a demonstration of how the Niton XL3t handheld XRF analyzer can be used as a valuable analytical tool for the mining industry. He shows how it can be used to analyze rock and mineral samples and outlines how the Niton XL3t can be connected to positioning systems to spatially map regions in minerals exploration applications.

Combined AFM and IR Spectroscopy with the NanoIR from Anasys Instruments

The NanoIR system from Anasys Instruments is a unique instrument that combines AFM and IR Spectroscopy. Kevin Kjoller explains how the system works, how they have been able to integrate an atomic force microscope and infrared spectroscope to generate topographical, localised mechanical, thermal and chemical data for polymeric and organic materials.

Stainless Steel Analysis with the Niton XL2 Handheld XRF Analyzer

Jon Shein from Thermo Fisher Scientific runs a demonstration, showing how quickly the Niton XL2 handheld XRF analyzer can be used to determine the composition of stainless steel samples.

The STA 449 F1 Simultaneous TGA/DSC from Netzsch Instruments

Dave Shepard from Netzsch Instruments shows us through their STA 449 F1 Jupiter simultaneous TGA/DSC (Thermogravimetric Analyzer/Differential Scanning Calorimeter). This instrument can be used to measure mass change and energy absorbed or given off, or enthalpy. This data can be used to determine such things as melting points, phase transformations, glass transition temperatures, thermal decomposition or oxidation.

Gold Jewelry Composition Determination Using a Niton XL2 Handheld XRF

Jon Shein from Thermo Fisher Scientific demonstrates how the Niton XL2 handheld XRF analyzer can quickly and easily determine the composition of precious metals like gold jewelry. In the space of less then 2 minutes the Niton XL2 accurately analyze 2 different samples

The Nanosurf LensAFM Designed to Integrate with Optical Microscopes and Profilers

The new LensAFM from Nanosurf has been designed to integrate with optical microscopes and profilers, and add AFM capabilities to them. This demonstration shows how easy it is to switching between AFM and optical microscopy/profiler modes.

Demonstration of Improved Resolution from Optical Profilers Using AcuityXR Technology from Bruker Nano

Chris Orsulak from Bruker points out the main features of the ContourGT Optical Profiler and briefly describes how it works. he also shows us how it can take measurements in very short time frames and how the new AcuityXR measurement mode (introduced at the 2010 MRS Fall Meeting) can produce improved results due to the increased lateral resolution.

The New XE-100 Series Atomic Force Microscopes from Park Systems

We are introduced to Park Systems new XE-100 series general purpose AFMs. Dr. Sang-il Park explains how the use of a x-y scanner and decoupled z scanner produces very flat scans and how their system can operate in a true non-contact mode to produce accurate, high resolution images, with excellent reproducibility. As well as topographical information, the XE-100 series AFMs can also measure electrical, magnetic, mechanical and optical properties of materials.

The Carl Zeiss Sigma VP Scanning Electron Microscope (SEM)

John Treadgold from Carl Zeiss NTS shows us the main features and specifications of the Sigma VP (Variable Pressure) scanning electron microscope (SEM). He covers its capabilities, including options for detectors etc and its ease of use and user interface as well as the ability to integrate the SEM with Carl Zeiss optical microscopes.

Testing Lead Content in Consumer Items Using a Handheld XRF Analyzer

Jon Shein from Thermo Fisher Scientific demonstrates how their Niton XL3t handheld XRF analyzer can quickly check for lead content/contamination in consumer items. With their in-built test program, you can quickly evaluate items on a pass/fail basis, making it ideal for quality control applications.