MRS 2008 Fall Meeting Video Interviews Videos

MRS 2008 Fall Meeting Video Interviews Videos
Shelley Begley from Agilent Technologies demonstrates how the 10GHz Split Cylinder Resonator is able to measure dielectric properties of low loss materials, thin films and substrates.
Agilent Technologies' Shelley Begley demonstrates their portable system for determining dielectric properties of liquids. The system centers around a portable network analyzer and ca be used for measuring properties such as permittivity and loss tangent.
This short video shows the key features and ease of operation of the SOLVER NEXT SPM/AFM from NT-MDT. It has been designed so that operators with limited experience can take quality measurements.
The Dimension V from Veeco combines an atomic force microscope (AFM) with a nanomechanical tester. This is achieved using a specifically designed probe. It is able to measure properties such as stiffness, adhesion and energy dissipation as well as provide the imaging capabilities of an AFM.
The Nano Indenter G200 is the most advanced platform for exploring material properties at the nano and micro scales. Its state of the art motion system speeds sample throughput without sacrificing accuracy. It also conforms to ISO 14577 - 1, 2 & 3; delivering confidence in test accuracy and repeatability.
Joe McGuire, Director of National Sales for Park Systems introduces us to the XE-70 Research AFM. He outlines the key features and attributes of this atomic force microscope, including hardware and software
The Dektak 150 Surface Profilometer from Veeco uses stylus profilometry technology, which is the accepted standard for surface topography measurements.
The CSM TTX Table Top Instrument is a high performance Nanoindentation Tester (NHT) in a small and simple-to-use package. It is suited to customary nanoindentation testing where a complete platform configuration is not required.
The Cypher AFM from Asylum Research is the most revolutionary small sample AFM released in the last decade. It features an envonmental chamber, high resolution scanner providing sub angstrom resolution and fast imaging thanks to the small cantilevers.
Ola Modinger from Nanosurf gives us and introduction to the their easyScan2 FlexAFM that was released at the 2008 MRS Fall Meeting, where this interview was recorded. We then get a demonstration of how easy this instrument is to operate.
The Agilent Technologies 7020 Zetaprobe measures zeta potential of suspensions. It can cater for samples with high solids loadings, which can eliminate the need for diluting samples.
The Agilent Technologies AccuSizer 780 is a laser diffraction particle size analyzer that measures the size of individual particle to produce high accuracy particle size distributions
The key features and capabilities of the XE-Bio AFM (atomic force microscope) are described. These include the unique scanning ion conductance microscopy (SICM) technology that allows imaging of living cells in liquid media.
The REVETEST Xpress is a cost effective solution for Industrial and Quality Control (QC) applications. This instrument provides measurement of adhesion, hardness and scratch resistance with a very user-friendly, intelligible interface.
Kevin Kjoller, Vice President of Product Development at Anasys Instruments demonstrates how easy the VESTA localized thermal analysis system is to use.
The Agilent Nicomp 380 ZLS can measuire both particle size and zeta potential. Particle size is determined by dynamic light scattering or DLS and trhe Nicomp 380 ZLS can measure particles from a few nanometers to microns.
Prof. Iain D. Baikie from KP Technology introduces us to the Scanning Kelvin Probe which measures the work function difference between a vibrating tip and the sample. It is suited to the analysis of such things as metals, electronic devices, patterned wafers, solar cells etc and can carry out similar functions to an AFM
Prof. Iain D. Baikie from KP Technology shows us their Ultrahigh Vacuum Kelvin Probe. It is used for measuring changes in a sample's surface such as may be the case when a coating is employed, due to temperature changes and can be adpated for use with semiconductors.
The key features and capabilities of the Park Systems XE-NSOM, atomic force microscope incorporating near-field scanning optical microscopy are demonstrated and a details explanation of its operation is provided.
Rick Olds from Ambios Technology shows us through the Q-View. The Q-View which combines scanning probe microscopy (SPM) and interferometer which are interchangeable for taking surface roughness and topography measurements on small and larger areas.
The Agilent 5600LS utilizes a fully addressable 200 mm x 200 mm stage and a new, low-noise AFM design. The programmable, motorized stage enables fast, accurate probe positioning for imaging and mapping large specimens at atomic-scale resolution using a state-of-the-art Agilent AFM.
The Nanoindenation platform is a versatile system available in two configuations that allow you to build a device tailored ot your specific requirements. You can incorporate various testing modules such as: Nano and microindentation; Nano and microscratc; and Micro/nanoscratch. You can also choose between imaging systems suc as a: Video microscope; AFM; or profilometer.
Marshall Bates and Andrey Krayev from AIST-NT demonstrate the ease of use of the AIST SmartSPM/AFM. From loading a sample to starting to take measurements can be completed in 1-2 minutes, at atomic resolutions
XOS manufacture polycapillary optics and doubly curved crystal optics. These are used in x-ray fluorescence, XRF (both wavelength dispersive and energy dispersive, WDXRF and EDXRF systems) as well as x-ray diffraction XRD systems, which are widely used in materials analysis. The addition of these optical systems allows the instrument to analyze smaller features with greater sensitivity
Ola Modinger from Nanosurf points out some of the key features of their easyScan2 FlexAFM that was released at the 2008 MRS Fall Meeting, where this interview was recorded.
The NT-MDT NTEGRA Aura system is a versatile SPM platform can be modified in numerous ways to adapt to various sample types as well as to take different types of measurements.
KP Technology's Prof. Iain D. Baikie explains how a Kelvin Probe works.