Diode Laser Analysis and Control from Resolution Spectra Systems

Determining the spectrum of a diode laser emission at a few µm is required for metrological applications based on other physical phenomena or interferometry such as the Raman effect which requires pure spectra.

Unless it is possible to implement an intrinsically pure laser such as a HeNe laser, integrators and users have a huge choice of diode laser sources with a capacity to evaluate source quality, the true operating range or component uniformity.

This may cause serious challenges in the understanding of results of metrological setups or industrializing products. Laser manufacturers can greatly benefit from performing spectrum control during production and systematically presenting spectrum data in their datasheets for sources used in metrological applications.

This can be performed reasonably with a high resolution spectrometer if there is no need to implement a highly complex instrument.

Resolution Spectra Spectrometers for Diode Laser Analysis

The spectrometers from Resolution Spectra are ideal for diode laser analysis and control in the 630 to 1083nm range. They can display a laser line profile up to a spectral resolution of 0.2cm-1.

Furthermore, a high data rate measurement capability (up to 30,000 fps) and a number of trigger mode options provide a unique configuration for testing pulsed lasers.

Furthermore, the user interface includes an automatic peak detection feature and a real time visualization of the peaks stability over time.

A few measurement possibilities are:

Determination of Operating Ranges

  • Central wavelength control with excellent absolute accuracy (down to 1µm)
  • Parasitic modes detection
  • Real-time / high-rate measurement (up to 30,000 fps)

Laser Stability Control

  • Characterizing laser and best operating point search
  • Control and record of the stability of your diode laser
  • Highly stable measurement

Source Purity Measurement

  • Development of new diodes
  • Manufacturing process drift detection
  • Quality control

About Resolution Spectra Systems

RESOLUTION Spectra Systems was set up in 2011 to develop an offer based on SWIFTS technology. Its founders are senior engineers, business managers and research scientists from the Joseph Fourier University of Grenoble in France. The company is also based in Grenoble, one of Europe’s leading high-technology centers.

RESOLUTION Spectra Systems is looking to revolutionize the use of spectrometers in the future. A combination of high performance, simplicity and compactness will allow SWIFTS-based spectrometers to be employed in configurations that were impossible for previous generations of spectrometer, opening up the use of high-performance spectroscopy to mainstream applications and enabling its integration with new or existing technologies.

The core benefits of SWIFTS, its compactness, portability and potential for integration, will provide real answers to current market requirements. This is particularly true for applications that require spectral discrimination with respect to molecular emission and absorption, including process control, laser spectroscopy for the analysis of materials, security and medical applications.

Our supply chain is based on processes developed in-house, but also on a smart scheme that takes advantage of the unique convergence of state-of-the-art technologies and facilities located in the Grenoble Cluster.

RESOLUTION Spectra Systems is developing several families of off-the-shelf spectrometers and is focusing its R&D efforts on tailoring solutions to applications that require a high level of performance, compactness, portability or simplicity.

RESOLUTION Spectra Systems is not only a powerful technology developer, it is also resolutely focused on serving customers and responding to their needs.

This information has been sourced, reviewed and adapted from materials provided by Resolution Spectra.

For more information on this source, please visit Resolution Spectra.

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