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A Schiff Base Nickel Complex. A New Material as Modifier for Selective Electrodes

CSMA is Working on the EU Funded ATOMICS Nano Devices Programme - News Item

CSMA Renews Contract with European Space Agency Relating to Laser-Induced Damage and Contamination -

Barrier Rib Forming by Photosensitive Paste for Plasma Display Panel

Optically Readable Hydrogen Sensor Using Pd/Y Double-Layered Thin Films

New Characterization Method for Macrostructures of Ceramics Hybrid Material

Surface Integrity Control During The Precision Machining Of Brittle Materials

Surface Integrity Control During The Precision Machining Of Brittle Materials

Aluminum-Pillaring of a Montmorillonitic Clay: Textural Properties as a Function of the Starting Mineral Particle Size

Aluminum-Pillaring of a Montmorillonitic Clay: Textural Properties as a Function of the Starting Mineral Particle Size

Electro-Optical Characterization of In-Situ Indium Doped CdS Thin Films by Chemical Bath

Zeolite Membranes Prepared by the Dry Gel Method for Gas Separation

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