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Semiconductor Ultra-High Purity Gas Analysis

To be decided by the editor

From Thermo Fisher Scientific – Environmental and Process Monitoring Instruments 5 Oct 2022

Using Focused Ion Beam Without Gallium For “Damage-Free” TEM Specimen Preparation

AZoM spoke with staff scientist for application development, Dr. Chengge Jiao of Thermo Fisher Scientific, about the use of a focused ion beam without gallium to move towards damage-free TEM specimen preparation.

From Thermo Fisher Scientific – Electron Microscopy Solutions 5 Oct 2022

Using Total Organic Carbon (TOC) Monitoring to Close the Metrology Gap

Sugar production requires immense amounts of water, which results in more opportunities for errors and contamination. In this article, SUEZ discusses how they use total organic carbon (TOC) monitoring to close the metrology gap and spot contamination.

From Veolia Water Technologies & Solutions 5 Oct 2022

Monitoring Condensates in the Manufacture of Animal Feed

Steam is utilized across all aspects of animal feed manufacture, be it sterilization, heating, or direct steam treatment. However, care must be taken to avoid condensate contamination of these steam processes. In this article, SUEZ discusses how they helped a client monitor for organics infiltration.

From Veolia Water Technologies & Solutions 5 Oct 2022

Strong and Heat-Resistant Synthetic Fiber Kevlar and its Composites

Kevlar is a synthetic material created from a chemical known as poly-para-phenylene terephthalamide. Here, we discuss this strong and heat-resistant synthetic fiber Kevlar, its properties, limitations, applications, and recent relevant studies.

By Huda Khan 4 Oct 2022

The Characterization of Bonded Wafers

The characterization of the bonded wafers is essential because it determines the process quality or the quality of the fabricated devices.

From FormFactor Inc. 4 Oct 2022

Explaining Wafer Applications in Surface Metrology

This article explains wafer applications in surface meteorology.

From FormFactor Inc. 4 Oct 2022

Discover Vertical Cavity Surface Emitting Lasers

Vertical Cavity Surface Emitting Lasers, better known as VCSELs, are an emerging technology with new applications in infrared lighting, proximity sensors, high-resolution video displays, atomic clocks and facial recognition technology.

From FormFactor Inc. 4 Oct 2022

What is Modular Optical Metrology?

SurfaceSens has a modular optical metrology set-up for hybrid surface process control.

From FormFactor Inc. 4 Oct 2022

Keeping Egypt's Water Clean with High-Quality Water Analysis

In this interview, AZoM talks to Dr. Barakat from The Reference Lab, Egypt, about their water analysis capabilities, their processes, and how Metrohm instruments play a large part in their success and quality.

From Metrohm Middle East FZC 3 Oct 2022