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Olympus NDT Announces Novel DELTA Window Guard for DELTA Handheld XRF Alloy Analyzers

Olympus NDT Announces Novel DELTA Window Guard for DELTA Handheld XRF Alloy Analyzers

Micromeritics Introduces TriStar® II Plus Surface Area and Porosity System

LECO Corporation to Showcase at Annual International Conference of the Metabolomics Society

WITec to Host the 10th Confocal Raman Imaging Symposium in Ulm, Gemarny

New Family of Rare-Earth Quasicrystals Discovered

New Family of Rare-Earth Quasicrystals Discovered

Solar Cell Do Not Perform Best at High Altitudes

Solar Cell Do Not Perform Best at High Altitudes

Waste to Energy (WTE) Conversion Technologies - New Book from Woodhead Publishing

Waste to Energy (WTE) Conversion Technologies - New Book from Woodhead Publishing

Printed Electronics Europe 2014 Dates Announced by IDTechEx

Xradia Extends X-ray Microscopy to Advance Pursuit of Discovery Previously Unachievable with Lab-based Imaging

Xradia Extends X-ray Microscopy to Advance Pursuit of Discovery Previously Unachievable with Lab-based Imaging

Cornell University to Receive the First VersaXRM-520 X-Ray Microscope from Xradia, Inc.

Cornell University to Receive the First VersaXRM-520 X-Ray Microscope from Xradia, Inc.

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